Structural modal parameter identification method based on wavelet and ICA improved EEMD

A technology for structural mode and parameter recognition, applied in character and pattern recognition, instruments, computer components, etc., can solve problems such as noise residue and too many false modes

Pending Publication Date: 2020-04-28
LIAONING UNIVERSITY OF PETROLEUM AND CHEMICAL TECHNOLOGY
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Problems solved by technology

[0005] The object of the present invention is to provide a kind of structural modal parameter identification method based on wavelet and ICA improved EEMD, have for the white noise residual after EEMD decomposition, modal mixing and the screening of effective IMFs etc., the wavelet in the wavelet transform The combination of soft threshold denoising and FastICA in ICA improves the advantages of EEMD, and solves the problem of judging too many false modes, noise residues and real IMF in the classic EEMD process

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  • Structural modal parameter identification method based on wavelet and ICA improved EEMD
  • Structural modal parameter identification method based on wavelet and ICA improved EEMD

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[0019] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0020] In the description of the invention, it should be noted that the terms "upper", "lower", "inner", "outer", "front end", "rear end", "both ends", "one end", "another end" etc. The indicated orientation or positional relationship is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the referre...

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Abstract

The invention discloses a structural modal parameter identification method based on wavelet and ICA improved EEMD. The method comprises steps of eliminating noise residues in the IMFs after classic EEMD decomposition by using a wavelet soft threshold denoising method in wavelets; after FastICA in ICA is used for processing, obtaining new IMFs, and removing modal aliasing; judging a real IMF component by using a correlation coefficient between the new IMFs and the original signal; removing a false mode, then obtaining free vibration response of each real IMFs by using a random decrement technology, and finally, identifying the frequency and damping ratio of the structure by using a method of combining Hilbert transform (HT) and a least square fitting technology. The method has the advantages that the problems of white noise residues after EEMD decomposition, modal aliasing, effective IMFs screening and the like are solved; wavelet soft threshold denoising in wavelet transform and FastICA in ICA are combined to improve the EEMD, and the problems of excessive false modes, noise residues and true IMF judgment in the classic EEMD process are solved.

Description

technical field [0001] The invention relates to the technical field of signal analysis and modal parameter identification method for structural vibration response, in particular to a structural modal parameter identification method based on wavelet and ICA improved EEMD. Background technique [0002] Empirical Modal Decomposition (EMD) has been widely used in signal processing and analysis in various fields since it was proposed. However, in the actual application process, due to some defects in the classical EMD method itself, such as mode aliasing and endpoint effect, it greatly hinders the further application of this method in practice. There are two reasons for the phenomenon of modal aliasing: one is related to the EMD algorithm itself, and the frequency characteristics of the original signal will also affect the decomposition results, and even modal aliasing occurs. For example, white noise residues and false modes after EEMD decomposition, and with the increasing app...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/00G06K9/62
CPCG06F2218/06G06F2218/08G06F18/2134
Inventor 付春刘娟姜绍飞王昆付丽丽王文武贾冯睿范影管海伟陆春光郝帅王卓
Owner LIAONING UNIVERSITY OF PETROLEUM AND CHEMICAL TECHNOLOGY
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