Noise evaluation method, reflectivity inversion method, and image analysis device
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
- Publication Date
- 2021-04-13
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Abstract
Description
Technical field
[0001] The present invention relates to the field of high spectral image analysis, and more particularly to a noise evaluation method, a reflectivity inversion method, and an image analysis device.Background technique
[0002] High-spectral images are widely used in the fields of agriculture, military, substitute target detection and target identification, and the spectrum as the "fingerprint" of the object, which plays a key during the target classification process. effect.
[0003] Since the high spectrometer imaging process is affected by multiple noise, the evaluation of noise in high-spectral images is difficult, and the prior art method is difficult to get accurate image noise value, and the correction of different environmental light sources is also a problem.
[0004] Further, the image measured by the high spectrometer often only has the relative radiation intensity information of the target, and the radiation intensity of the same target will also exhibit a lot of differ...