Noise evaluation method, reflectivity inversion method, and image analysis device

A noise evaluation and image analysis technology, applied in the field of hyperspectral image analysis, can solve the problem of large noise evaluation error, and achieve the effect of high precision, high efficiency and reducing dark noise.

Active Publication Date: 2021-04-13
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Abstract
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  • Claims
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Problems solved by technology

[0014] In view of this, in order to solve the problem of large noise evaluation errors in existing hyperspectral images, the present invention provides a noise evaluation method, which includes the following steps:

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  • Noise evaluation method, reflectivity inversion method, and image analysis device
  • Noise evaluation method, reflectivity inversion method, and image analysis device
  • Noise evaluation method, reflectivity inversion method, and image analysis device

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Embodiment Construction

[0044]The above and additional technical features and advantages of the present invention will be described in more detail below with reference to the accompanying drawings.

[0045]In the description of the present invention, it is to be understood that the term "first", "second" is used only for the purpose of describing purposes, and cannot be understood as an indication or implies a relative importance or implicitting the number of technical features indicated. Thus, features with "first", "second" may be indicated or implicitly including at least one of this feature. In the description of the invention, the meaning of "multiple" is at least two unless otherwise specifically defined.

[0046]In the present invention, the terms "installation", "connected", "connection", "fixed", such as the term "mount", "connected", "linked", "fixed", unless otherwise expressly specifically understood, for example, can be a fixed connection, or a detachable connection Or integral; may be mechanical co...

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Abstract

The invention provides a noise evaluation method, a reflectance inversion method and an image analysis device. The device includes a hyperspectral image acquisition device and a hyperspectral image processing device connected to each other. The hyperspectral image acquisition device includes: a sample table, a standard reflectance A plate, a hyperspectral instrument, a turntable and an illumination system, the sample stage is placed on the turntable, and standard reflectivity plates are respectively placed on both sides of the sample stage; the hyperspectral image processing device is used to implement the noise evaluation method and the reflectivity inversion method. The device can reduce the influence of uneven illumination on the image quality in the hyperspectral image acquisition process of the image, and the image analysis device can solve the noise approximation value of each point of the image, and invert the reflectance of the hyperspectral image accordingly. The device can perform noise evaluation and reflectivity inversion process more conveniently, efficiently and with high precision.

Description

Technical field[0001]The present invention relates to the field of high spectral image analysis, and more particularly to a noise evaluation method, a reflectivity inversion method, and an image analysis device.Background technique[0002]High-spectral images are widely used in the fields of agriculture, military, substitute target detection and target identification, and the spectrum as the "fingerprint" of the object, which plays a key during the target classification process. effect.[0003]Since the high spectrometer imaging process is affected by multiple noise, the evaluation of noise in high-spectral images is difficult, and the prior art method is difficult to get accurate image noise value, and the correction of different environmental light sources is also a problem.[0004]Further, the image measured by the high spectrometer often only has the relative radiation intensity information of the target, and the radiation intensity of the same target will also exhibit a lot of differ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/28G01J3/02G01J3/10
CPCG01J3/0208G01J3/10G01J3/2823G01J2003/2866
Inventor 谭鑫宁鸿章许亮李耀彬焦庆斌李文昊李宇航许玉兴邹宇博杨琳
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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