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A Calculation Method of Test Time Based on Multi-stress Accelerated Life Model

A technology of accelerated life and test time, applied in the field of test time calculation based on multi-stress accelerated life model

Active Publication Date: 2022-08-02
CHINA AEROSPACE STANDARDIZATION INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The invention provides a test time calculation method based on a multi-stress accelerated life model, which solves the problem of verifying the storage period of electronic products under multi-stress conditions (vibration, temperature, humidity, electricity and other stress parameters), and can cover electronic products in Accelerated test verification of transportation phase, storage phase, power-on standby, etc. in the life cycle

Method used

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  • A Calculation Method of Test Time Based on Multi-stress Accelerated Life Model
  • A Calculation Method of Test Time Based on Multi-stress Accelerated Life Model
  • A Calculation Method of Test Time Based on Multi-stress Accelerated Life Model

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Experimental program
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Effect test

Embodiment 1

[0060]S01, analyze the storage period indicators;

[0061] The storage period index includes the transit time t that needs to be experienced 1 = 96 hours, storage time t 2 = 8760 hours, power-on standby time t 3 = 48 hours, γ = 0.8, storage period of 8 years.

[0062] S02, decompose the storage section;

[0063] In this example, E 0 Vibration spectrum according to highway truck vibration environment.

[0064] storage stage T 0 = 298K, there are 2 days in a year in the power-on standby phase, and each day is calculated as 24 hours, which is equivalent to a total of E 0 =5.0v.

[0065] S03 analysis test stress;

[0066] The transportation stage test refers to the fourth type of fastened cargo transportation method in GJB150.16A-2009 "Laboratory Environmental Test Methods for Military Equipment Part 16: Vibration Test". The process of moving equipment from the manufacturing site to the final use site is generally divided into two stages: high-speed power trucking and mis...

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Abstract

The invention provides a test time calculation method based on a multi-stress accelerated life model, which solves the problem of verifying the storage period of electronic products under multi-stress conditions (various stress parameters such as vibration, temperature, humidity, electricity, etc.). Step 1, analyze the storage period index to obtain the transportation time, storage time, and power-on standby time; Step 2, decompose the storage profile to obtain the vibration magnitude in the transportation stage, the temperature and humidity values ​​in the storage stage, and the voltage value in the power-on standby stage; Step 3, analyze the test stress, and obtain the vibration stress in the transportation stage, the highest temperature stress and the highest humidity stress in the storage stage, and the highest electrical stress in the power-on standby stage; Step 4, calculate the acceleration factor in the transportation stage, the acceleration factor in the storage stage and Acceleration factor in power-on standby stage; Step 5: Calculate the test time according to the acceleration factor.

Description

technical field [0001] The invention belongs to the technical field of aerospace reliability, and relates to a test time calculation method based on a multi-stress accelerated life model. Background technique [0002] Storage life is one of the important tactical indicators of weapons and equipment. Accelerated testing is generally used to verify the storage period, which requires a life model and test time. In the past, single-stress or double-stress accelerated life models were often used in this regard, such as the Arrhenius model, which uses temperature stress for accelerated testing; the inverse power law model uses electrical stress for accelerated testing. These models did not consider other stress conditions during the accelerated test, and the fault conditions encountered during the actual storage process were inconsistent with the conditions during the test, resulting in inaccurate and incomplete test results. [0003] In the past storage life verification issues,...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01M13/00G01M99/00
CPCG01R31/003G01M13/00G01M99/005
Inventor 徐洪武陈凤熹朱炜王伟蔡健平张晓军伍招冲施帆松钛张睿宋汝宁
Owner CHINA AEROSPACE STANDARDIZATION INST