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Device and method for testing ablation resistance of moving arc contact

A technology for moving arc contacts and testing devices, which is applied to measurement devices, weather resistance/light resistance/corrosion resistance, instruments, etc., can solve the problems of high cost and high cost when testing the ablation resistance of arc contacts, and achieve low cost , The effect of fast heating and reliable closing

Active Publication Date: 2020-05-26
PINGGAO GRP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a test device for the ablation resistance performance of the moving arc contact to solve the problem of high cost in testing the ablation resistance performance of the arc contact in the prior art. Another purpose of the present invention is to provide A method for testing the ablation resistance performance of moving arc contacts, which is used to solve the problem of high cost in testing the ablation resistance performance of arc contacts in the prior art

Method used

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  • Device and method for testing ablation resistance of moving arc contact
  • Device and method for testing ablation resistance of moving arc contact

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specific Embodiment 2

[0050] Specific embodiment 2 of the ablation resistance test device for moving arc contacts of the present application: The difference between this embodiment and specific embodiment 1 is that the static arc contacts are fixed on the fixed frame, and the moving arc contacts move with Close to or away from the static arc contact to realize the uncharged opening and closing of the dynamic and static arc contacts.

specific Embodiment 3

[0051] Specific embodiment 3 of the ablation resistance test device for moving arc contacts of the present application: the difference between this embodiment and specific embodiment 1 is that the moving and static arcing contacts move toward each other to realize the dynamic and static arcing contacts At this time, the closing speed is obtained by adding the moving speeds of the dynamic and static arc contacts.

specific Embodiment 4

[0052] Specific embodiment 4 of the ablation resistance performance testing device for moving arc contacts of the present application: The difference between this embodiment and specific embodiment 1 is that the transition piece is not detachably arranged on the moving arc contact fixing plate, at this time The moving arc contact can reliably maintain its position during the detection process, and this embodiment is suitable for users with relatively single product models.

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Abstract

The invention relates to a device and a method for testing ablation resistance of a moving arc contact. The device comprises a driving device used for driving moving arc contact and static arc contact to be disconnected and connected in an uncharged mode, a temperature control device used for simulating the temperature of the moving arc contact during current breaking, and a detection device used for detecting at least one of the inner diameter of the moving arc contact before and after the moving arc contact is closed, the closing bounce time during closing and the closing resistance. In different switching-on temperature with the same switching-on speed, at least one of the inner diameters of the moving arc contact before and after closing of the moving arc contact, the closing bouncetime during closing and the closing resistance is detected and analyzed. According to the technical scheme, the ablation resistance of the moving arc contact can be tested, the ablation resistance ofthe moving arc contacts of different types is compared, the ablation resistance of the moving arc contacts of various types is evaluated, and compared with the mode that the moving arc contacts are installed on a sulfur hexafluoride circuit breaker for ablation resistance testing, the cost is low.

Description

technical field [0001] The invention relates to a test device and a test method for the ablation resistance performance of a moving arc contact. Background technique [0002] Sulfur hexafluoride circuit breakers usually adopt a double-contact structure, which is divided into main contacts and arc contacts. arc generated by current flow. [0003] The arcing contact generally adopts a self-supporting contact finger structure, relying on the elastic force of the contact finger of the moving arcing contact as the holding force to hold the static arcing contact tightly, so as to ensure reliable electrical contact between the moving arcing contact and the static arcing contact. When the arc contact opens and closes the current, the arc generates high temperature and ablates the arc contact. At the same time, the temperature rise will reduce the mechanical properties of the contact finger of the moving arc contact, reduce the yield strength, reduce or even disappear the elastic de...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N17/00G01N25/00
CPCG01N17/00G01N25/00
Inventor 李禹生张洪铁朱苛娄何保营苑国旗刘春梅董祥渊许东杰安影李琼可陆静尹世献
Owner PINGGAO GRP
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