Neutral atom imaging unit signal analysis method

A signal analysis method and neutral atom technology, applied in the direction of material analysis using wave/particle radiation, material analysis, material analysis using radiation, etc., can solve the technical problems of detection results and other problems, and achieve accurate and easy inversion results The effect of execution

Active Publication Date: 2020-06-02
PEKING UNIV
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

However, the analysis of the detection results is still a technical problem

Method used

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  • Neutral atom imaging unit signal analysis method
  • Neutral atom imaging unit signal analysis method
  • Neutral atom imaging unit signal analysis method

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Embodiment 1

[0060] This embodiment provides a signal analysis method of a neutral atom imaging unit, such as figure 1 As shown, the above neutral atom imaging unit signal analysis method includes the following steps:

[0061] S101: Provide a neutral atom imaging unit, the neutral atom imaging unit includes a semiconductor detector array and modulation grids arranged at intervals in front of the detector array; the neutral atom imaging unit used in this application can adopt the application The neutral atom imaging unit described in the Chinese patent application No. 2018115484208 is used as a reference, and the content of this patent application is included in this application.

[0062] Such as figure 2 As shown in , a schematic diagram of the simulation of the imaging process of the neutral atom imaging unit is schematically shown. The neutral atom imaging unit 100 includes a modulation grid 101 and a semiconductor detector array 102 arranged behind the modulation grid. image 3 A sche...

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Abstract

The invention provides a neutral atom imaging unit signal analysis method. The neutral atom imaging unit signal analysis method comprises the steps of: providing a neutral atom imaging unit which comprises a semiconductor detector array and modulation grids disposed in front of the detector array at intervals; providing a neutral atom source plane, wherein energy neutral atoms emitted by the neutral atom source plane are received by the detector array after passing through the modulation grids, and the modulation grids form projection on the detector array; acquiring a detector response function according to the projection; calculating a data signal obtained by the neutral atom imaging unit; and performing inversion imaging on a neutral atom emission source according to the detector response function and the data signal. According to the neutral atom imaging unit signal analysis method, the neutral atom emission source can be well inverted according to neutral atom information obtainedby the detector, such as counting of neutral atoms in different bands, so that the neutral atom emission source is imaged, and the intensity and the size of the neutral atom emission source are obtained. The neutral atom imaging unit signal analysis method is easy to implement, and the inversion result is accurate.

Description

technical field [0001] The present application relates to the field of neutral atom imaging, in particular to a signal analysis method of a neutral atom imaging unit. Background technique [0002] Holistic observation and global imaging have become one of the important development approaches to solve geophysical problems. Energy-neutral atoms (ENA) are generated during the charge exchange process between the ring current ions and the thermal particle components of the geocorona, and the ENAs are not bound by the magnetic field and can leave the source region along a straight line at the speed of the original energy ions. Telemetric ENA imaging thus also offers new opportunities to distinguish temporal and spatial variations of space plasmas. [0003] Since most of the current low-energy ENA detectors are made of channel multipliers and micro-channel plates plus diffraction filters, and these ENA detectors are still severely affected by ultraviolet radiation, almost no scien...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/29
CPCG01T1/2914G01T1/2928G01T1/295G01N23/04G01N2223/10G01N2223/304
Inventor 王永福宗秋刚陈鸿飞王玲华邹鸿于向前施伟红周率
Owner PEKING UNIV
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