Neutral atom imaging unit signal analysis method
A signal analysis method and neutral atom technology, applied in the direction of material analysis using wave/particle radiation, material analysis, material analysis using radiation, etc., can solve the technical problems of detection results and other problems, and achieve accurate and easy inversion results The effect of execution
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[0060] This embodiment provides a signal analysis method of a neutral atom imaging unit, such as figure 1 As shown, the above neutral atom imaging unit signal analysis method includes the following steps:
[0061] S101: Provide a neutral atom imaging unit, the neutral atom imaging unit includes a semiconductor detector array and modulation grids arranged at intervals in front of the detector array; the neutral atom imaging unit used in this application can adopt the application The neutral atom imaging unit described in the Chinese patent application No. 2018115484208 is used as a reference, and the content of this patent application is included in this application.
[0062] Such as figure 2 As shown in , a schematic diagram of the simulation of the imaging process of the neutral atom imaging unit is schematically shown. The neutral atom imaging unit 100 includes a modulation grid 101 and a semiconductor detector array 102 arranged behind the modulation grid. image 3 A sche...
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