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A correction method and system for reducing the influence of dust in the optical path on infrared temperature measurement

A technology of infrared temperature measurement and correction method, which is applied in the field of infrared temperature measurement, can solve the problems of low accuracy of infrared temperature measurement, achieve the effects of improving temperature measurement accuracy, promoting engineering realization, and expanding the selection range

Active Publication Date: 2020-12-01
CENT SOUTH UNIV
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Problems solved by technology

[0015] The invention provides a correction method and system for reducing the influence of dust in the optical path on infrared temperature measurement, which solves the technical problem of low accuracy of infrared temperature measurement in the existing dusty environment

Method used

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  • A correction method and system for reducing the influence of dust in the optical path on infrared temperature measurement
  • A correction method and system for reducing the influence of dust in the optical path on infrared temperature measurement
  • A correction method and system for reducing the influence of dust in the optical path on infrared temperature measurement

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Embodiment 1

[0064] refer to figure 1 The correction method for reducing the influence of dust in the optical path on infrared temperature measurement provided by Embodiment 1 of the present invention includes:

[0065] Step S101, establishing an original mechanism model according to the principle of infrared temperature measurement;

[0066] Step S102, based on the original mechanism model and a reference body under the influence of dust, the dust transmittance is obtained, and the reference body is a reference object whose real temperature and emissivity are known;

[0067] Step S103, based on the original mechanism model and the dust transmittance, establish a mechanism correction model under the influence of dust;

[0068] Step S104, based on the mechanism correction model, the infrared temperature measurement result under the influence of dust is obtained.

[0069] The correction method for reducing the influence of dust in the optical path on infrared temperature measurement provid...

Embodiment 2

[0072] refer to figure 2 The correction method for reducing the influence of dust in the optical path on infrared temperature measurement provided by Embodiment 2 of the present invention includes:

[0073] In step S201, an original mechanism model is established according to the principle of infrared temperature measurement. According to the principle of infrared temperature measurement in this embodiment, the establishment of the original mechanism model includes:

[0074] Step 1, obtain the total infrared radiation received by the infrared camera under the influence of dust, the calculation formula of the total infrared radiation is: W rd =ε 0 τ d W 0 +ε dust τ a W d +ρ 0 τ d W u +ε a W a , where W rd , W 0 , W d , W u and W a Respectively represent the infrared radiation received by the infrared thermal imager, the infrared radiation of the measured object, the infrared radiation of dust, the infrared radiation of the background and the infrared radiation...

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Abstract

The invention discloses a correction method and system for reducing the influence of dust in the optical path on infrared temperature measurement. According to the principle of infrared temperature measurement, an original mechanism model is established, and the dust transmittance is obtained based on the original mechanism model and a reference body under the influence of dust. Based on the original mechanism model and dust transmittance, a mechanism correction model under the influence of dust is established. Based on the mechanism correction model, the infrared temperature measurement results under the influence of dust are obtained, and the technical problem of low accuracy of infrared temperature measurement under the existing dust environment is solved. The calculation method of the dust transmittance of the reference body can accurately obtain the key parameters of the dust transmittance used to determine the mechanism correction model. In addition, the approximate dust transmittance calculation method and approximate correction model proposed by the present invention expand the selection range of the reference body, simplify the dust transmittance calculation process, weaken the application limitations of the correction model, and facilitate the engineering realization of the correction model , which improves the temperature measurement accuracy of the infrared thermal imager in a dusty environment.

Description

technical field [0001] The invention relates to the technical field of infrared temperature measurement, in particular to a correction method and system for reducing the influence of dust in an optical path on infrared temperature measurement. Background technique [0002] Infrared thermal imaging cameras are often used for temperature detection and non-destructive detection. It has the advantages of non-contact, providing two-dimensional thermal images, and being harmless to the human body. It has a wide range of applications in aerospace, medical, electronics, agriculture, and metallurgy industries. . However, since this infrared temperature measurement method is a non-contact temperature measurement method, it is easily disturbed by environmental factors and affects its detection accuracy. Especially in the metallurgical process, there will be interference such as high temperature, dust, and water mist in the production process, which limits the application of infrared t...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J5/06
CPCG01J5/06G01J5/80
Inventor 蒋朝辉潘冬桂卫华陈致蓬何磊
Owner CENT SOUTH UNIV