Pose adjustment method of line structured light sensor

Abstract

The invention discloses a method for adjusting the pose of a structured light sensor. The method comprises the following steps: extracting a light bar center point; calculating corresponding feature lines and feature points according to the line types formed by the light bar center points, namely an intersection straight line, a different-plane straight line, a parallel straight line and a plurality of arc lines; calculating an included angle between the characteristic line and the reference line, and recording the included angle as an angle deviation theta; calculating a vector V between thefeature point and the reference point and an included angle beta between the vector V and the reference point; wherein the datum line and the datum point are obtained through a pre-teaching process; calculating position deviation; adjusting the pose of the sensor / measured object according to the angle deviation theta and the position deviation, so that the pose of the to-be-measured optical stripmeets the measurement requirement. According to the method, targeted calculation can be effectively carried out on various light bar lines, the position deviation value of the sensor is accurately obtained, and the detection precision and the detection stability of equipment are improved.

Description

technical field [0001] The invention relates to the field of laser vision measurement, in particular to a method for adjusting the pose of a line structured light sensor. Background technique [0002] The line-structured light measurement technology projects the line-structured light onto the surface of the object to be measured, and the laser stripe image is captured by the camera, and then the three-dimensional coordinate information of the surface of the object to be measured is calculated by the light strip center extraction algorithm and the camera calibration model. In recent years, with the rapid development of photoelectric sensing technology, computer technology and optical semiconductor technology, line-structured light measurement has been widely used in the fields of industrial inspection, target recognition and reverse engineering due to its non-contact, high-efficiency and real-time measurement characteristics. [0003] The visual acquisition element (camera) i...

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Problems solved by technology

[0003] The visual acquisition element (camera) in the line structured light sensor is often fixed inside the device, and the quality of the captured image depends on the positional relationship between the sensor and the measured object. If the relative position inclination angle of the line structured light sensor and the measured object When it is too large, there may be a blind area of ​​image acquisition, so that the characteristic target of the measured object is not in the detection area; and when the distance between the line structured light sensor and the measured object is too far or too close, especially the characteristic target of the measured object is not in the detection area. When the detection equipment is within the depth of field range, the collected image will become blurred and cannot be clearly focused, which will affect the accuracy and robustness of the detection results

In order to obtain the relative position between the sensor and the measured object, CN201910385763.5 discloses a handheld visual detection device and its pose detection method, which provides a pose adjustment method for the situation where the light bar presents a straight line, but The line type of the measured light bar is: cross, different plane, convex, parallel, concave, fluctuating, etc.

In fact, line structured light is often used to measure the gap and surface difference characteristics of the measured object. In this measurement process, the light bars are usually in the state of crossing, different planes, and parallel, and there will be protrusions and disconnections (the measured The position of the surface difference of the object has a gap), obvious protrusion (the position only has the surface difference), or arc-shaped (for example: the measured object is spherical or cylindrical, and the light bar is usually arc-shaped), for this kind of light bar , existing methods cannot effectively adjust

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