Method and system for automatically generating DDR chip test standard report

Abstract

The invention belongs to the technical field of chips, and discloses a method for automatically generating a DDR chip test standard report. The method comprises: acquiring a clock frequency for testing the actual application of a DDR chip; calculating a DDR data clock corresponding to the clock frequency; querying a DDR data table according to the DDR data clock to obtain a test standard index matched with the DDR clock, wherein the DDR data table is used for storing a plurality of conventional DDR data clocks and test standard indexes corresponding to the conventional DDR data clocks; and generating a DDR chip test standard report containing the test standard index. Correspondingly, the invention further discloses a system for automatically generating the DDR chip test standard report. Bymeans of the method for automatically generating the DDR chip test standard report, all defects of manual test standard searching in the prior art can be avoided, report quality is good, cost is low,and the method can be suitable for searching of DDR chip test standards in all research and development stages.

Description

technical field [0001] The invention relates to the field of chip technology, in particular to a method and system for automatically generating a DDR chip test standard report. Background technique [0002] DDR, or DDR SDRAM, has been widely used in electronic products. At present, hardware test engineers in the industry need to manually search the DDR chip datasheet (data sheet) to inquire about the DDR chip test standard. The specific steps are: the hardware test engineer needs to complete a DDR chip test project, and then according to the corresponding part number The datasheet (data sheet) of the DDR chip searches for the required test standards. If the clock frequency of the actual DDR chip is exactly the same as the clock frequency of the datasheet (data sheet) of the DDR chip, you can manually search and sort out the specific test standards and fill them in the test data (test data ) in the Criteria (condition) in the table; there is another case where the actual DDR...

AI Technical Summary

Problems solved by technology

At present, hardware test engineers in the industry need to manually search the DDR chip datasheet (data sheet) to inquire about the DDR chip test standard. The specific steps are: the hardware test engineer needs to complete a DDR chip test project, and then according to the corresponding part number The datasheet (data sheet) of the DDR chip searches for the required test standards. If the clock frequency of the actual DDR chip is exactly the same as the clock frequency of the datasheet (data sheet) of the DDR chip, you can manually search for the specific test standards and fill them in the test data (test data ) in the Criteria (condition) in the table; there is another case that the DDR clock frequency in the actual application does not match the DDR clock frequency in the datasheet (data sheet), and it is necessary to re-find the DDRdatasheet that matches the actual clock DDR clock ( Data table), the above two cases will consume a lot of manpower and resource costs in operation. Sometimes a large amount of data comparison will cause data level misalignment, resulting in abnormal criteria. This step needs to be executed repeatedly, which is time-consuming and cumbersome. , error prone, reports poor quality

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