Three-dimensional memory and three-dimensional memory manufacturing method

A manufacturing method and memory technology, applied in the field of memory

Active Publication Date: 2020-07-07
YANGTZE MEMORY TECH CO LTD
View PDF10 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention provides a three-dimensional memory and a manufacturing method of the three-dimensional memory to ov...

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Three-dimensional memory and three-dimensional memory manufacturing method
  • Three-dimensional memory and three-dimensional memory manufacturing method
  • Three-dimensional memory and three-dimensional memory manufacturing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0055] The specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present invention, and the present invention is not limited to the following specific embodiments.

[0056] Three-dimensional memory can realize the storage and transmission of data in three-dimensional space, which can greatly improve the storage capacity of the device.

[0057] In the related art, a three-dimensional memory includes a substrate and a stack structure stacked on the substrate, wherein the stack structure includes a plurality of gate layers and a plurality of insulating layers alternately arranged; the stack structure is provided with a channel structure penetrating through the substrate and The common source contact, the channel structure includes a channel layer and a functional layer, and the sidewall of the func...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a three-dimensional memory and a three-dimensional memory manufacturing method. The three-dimensional memory comprises a substrate, a stack structure and an external structure,wherein the stack structure and the external structure are arranged on the substrate; the external structure is connected to the peripheral edge of the stack structure, and the external structure is provided with a conductive contact penetrating through the external structure; a channel structure penetrating through the stack structure is arranged in the stack structure; a conductor extending parallel to the substrate is arranged on one side, deviating from the stack structure, of the substrate, a first conductive part penetrating through the substrate is arranged at one end of the conductor,and the first conductive part is electrically connected with the conductive contact; and the other end of the conductor is provided with a second conductive part, and the second conductive part is embedded into the substrate corresponding to the stack structure and is electrically connected with the channel structure, so a common source contact in the stack structure in related technologies can becanceled, the problem of forming a coupling capacitor is avoided, and the reading and erasing rates of the three-dimensional memory are improved.

Description

technical field [0001] The invention relates to the technical field of memory, in particular to a three-dimensional memory and a method for manufacturing the three-dimensional memory. Background technique [0002] With the rapid development of technologies such as big data, cloud computing, and the Internet of Things, the requirements for memory integration and storage density have also increased. Traditional two-dimensional planar memory has been difficult to meet actual needs and is gradually being replaced by three-dimensional memory. [0003] In the related art, a three-dimensional memory includes a substrate and a stack structure stacked on the substrate, wherein the stack structure includes a plurality of gate layers and a plurality of insulating layers alternately arranged; the stack structure is provided with a channel structure penetrating through the substrate and A common source contact, a dielectric layer is disposed between the common source contact and the gate...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H01L27/1157H01L27/11573H01L27/11575H01L27/11582
CPCH10B43/50H10B43/40H10B43/35H10B43/27
Inventor 张坤孙中旺吴林春刘磊周文犀
Owner YANGTZE MEMORY TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products