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Optical time domain reflectometer and light pulse test method

An optical time domain reflectometer and optical pulse technology, which is applied in optical instrument testing, reflectometers for detecting backscattered light in the time domain, testing optical fiber/optical waveguide equipment, etc., can solve problems such as longer measurement time

Active Publication Date: 2020-08-04
ANRITSU CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in the method of Patent Document 1, two or more pulse widths are used for one measurement, so there is a problem that measurement time becomes longer

Method used

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  • Optical time domain reflectometer and light pulse test method
  • Optical time domain reflectometer and light pulse test method
  • Optical time domain reflectometer and light pulse test method

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Embodiment Construction

[0050] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In addition, this invention is not limited to embodiment shown below. These examples are merely illustrations, and the present invention can be implemented with various modifications and improvements based on the knowledge of those skilled in the art. In addition, in this specification and drawings, the component element with the same code|symbol represents a mutually identical component element.

[0051] exist figure 1 A configuration example of an optical time domain reflectometer according to the present invention is shown in . The optical time domain reflectometer 101 according to the present invention includes an LD (Laser Diode) 11 functioning as a light source, an LD control unit 12 functioning as a pulse width setting unit, and a functioning optical receiver. APD (Avalanche PhotoDiode / Avalanche Photodiode) 16, a receiving circuit 17, a CPU (Central Pr...

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Abstract

An optical time domain reflectometer includes: a storage unit (20) that stores in advance a third backscattered light level PZ(W2) obtained by adding a difference delta PR between a first backscattered light level PR(W1) which is measured using a first pulse width W1 and a second backscattered light level PR(W2) which is measured using a second pulse width W2 to a first backscattered light level PZ(W1) at a connection point DD to a measurement target optical fiber which is measured using the first pulse width so as to be associated with the second pulse width; and an arithmetic processing unit(18) that reads the third backscattered light level PZ(W2) at the second pulse width corresponding to a pulse width of an optical pulse output from a light source to the measurement target optical fiber from the storage unit and calculates a transmission loss LT in the measurement target optical fiber by using the read third backscattered light level PZ(W2).

Description

technical field [0001] The invention relates to an OTDR (Optical Time Domain Reflectometer) and an optical pulse test method using the OTDR. Background technique [0002] OTDR measurement is performed to measure the loss of the optical transmission channel, etc. In OTDR measurement, light pulses from a light source are output to the fiber under test, and the power of backscattered light in the fiber under test is measured. The light pulse from the light source is output to the optical fiber to be measured through the connecting joint connected with the virtual optical fiber in the device. In general, the total loss of the fiber under test connected to the OTDR uses the difference between the level of backscattered light power in the proximal end of the OTDR (the point of connection to the outside of the device) and the level of backscattered light power in the end of the fiber under test and the sum of the losses in the connected joints are calculated. Good or bad decisio...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/00
CPCG01M11/30G01M11/3145
Inventor 村上太一
Owner ANRITSU CORP