Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Crimping type power device static characteristic measurement system

A static characteristic and measurement system technology, applied in the direction of single semiconductor device testing, measuring electricity, measuring devices, etc., can solve the problems that cannot meet the static characteristic test requirements, do not have the ability to apply temperature at the same time, and meet the requirements of reducing machining , Eliminate influence, improve the effect of accuracy

Active Publication Date: 2020-08-04
NORTH CHINA ELECTRIC POWER UNIV (BAODING) +1
View PDF8 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The current static characteristic measurement device for crimped power devices only considers the uniform application of pressure on the crimped power device, but it does not have the ability to apply temperature at the same time, nor can it meet the static characteristic test that requires accurate voltage measurement need

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Crimping type power device static characteristic measurement system
  • Crimping type power device static characteristic measurement system
  • Crimping type power device static characteristic measurement system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0030] This embodiment provides a system for measuring the static characteristics of crimping type power devices. The static characteristics testing system includes: a frame 1 composed of components in the horizontal direction and columns 11 arranged in the vertical direction, a measuring fixture 2, and a device under test 3 , Box 5, temperature applying device 6 and pressure applying device 7.

[0031] Such as figure 1 and figure 2 As shown, the structure inside the casing 5 is specifically as follows:

[0032] The frame 1 is composed of components in the horizontal direction and columns 11 arranged in the vertical direction. The components in the horizontal direction include an upper base plate 12 and a lower base plate 13 , and the pillars 11 pass through the upper base plate 12 and the lower base plate 13 at the same time, and are distributed at the four corners of the upper base plate 12 and the lower base plate 13 . Both the upper base plate 12 and the lower base pla...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a crimping type power device static characteristic measuring system. The system comprises a frame, a pressure applying device and a temperature applying device, wherein the frame is composed of components in a horizontal direction and stand columns arranged in a vertical direction. According to the static characteristic measuring device, a Kelvin test method is introducedinto a test fixture; measurement errors of leads are excluded, the pressure applying device is in point contact with the frame; a processing requirement of the pressure applying device can be reduced;and a box body is used for controlling a temperature of the tested device, uniform temperature control of the tested device can be realized in a heating or cooling process, the temperature of the tested device can be accurately measured in real time, and the system is very suitable for accurately measuring the static characteristics of the crimping type device under different temperatures and different pressures.

Description

technical field [0001] The invention relates to the field of semiconductor device testing, in particular to a static characteristic measuring system of a crimping type power device which can apply temperature and pressure simultaneously. Background technique [0002] Press-fit power devices are the core components of high-voltage and large-capacity equipment. They are widely used in power systems, rail transit, new energy vehicles, military and aviation fields. It exhibits advantages such as short-circuit failure mode, and is very suitable for high-voltage and large-capacity applications. It has become a basic device to support the development of smart grids. [0003] The static characteristics of press-fit power devices, such as output characteristics and transfer characteristics, are the basic parameters for modeling, performance evaluation and reliability research of press-fit power devices, and are also important reference indicators for subsequent research. The fast an...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/26G01R1/04
CPCG01R31/2601
Inventor 杨艺烜闫音蓓彭程李学宝赵志斌崔翔唐新灵
Owner NORTH CHINA ELECTRIC POWER UNIV (BAODING)
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com