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Thermoelectric device performance test system and test method

A technology for thermoelectric devices and test systems, which is applied in the direction of single semiconductor device testing, instruments, measuring electricity, etc., can solve problems such as large measurement errors and inaccurate test methods, and achieve the effect of reducing heat loss

Pending Publication Date: 2020-08-11
SHENZHEN POLYTECHNIC
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The technical problem to be solved by the present invention is: to provide a thermoelectric device performance test system and test method, to solve the existing thermoelectric device performance test system and test method inaccurate, large measurement error and other problems

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  • Thermoelectric device performance test system and test method
  • Thermoelectric device performance test system and test method

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Embodiment Construction

[0039] It should be noted that, in the case of no conflict, the various embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be further described in detail below in conjunction with the drawings and specific embodiments.

[0040] Please refer to figure 1 As shown, the present invention relates to a thermoelectric device performance testing system for accurately measuring the power generation performance of a thermoelectric device under a stable temperature difference, such as device output current, voltage, output power and thermoelectric conversion efficiency. The measurement system of the electrical performance of the thermoelectric device in the embodiment of the present invention mainly includes: a pressurized support 1, a heat preservation block 3, a heating block 4, a cooling block 6, a water cooling radiator 7, a pressure sensor 8, a thermal insulation gasket 2, a plurality of heating Devi...

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Abstract

The invention relates to a thermoelectric device performance test system and test method, and the test system comprises a pressurization support, a heating block and a cooling block, the heating blockand the cooling block are installed in the support and are used for heating a hot end of a thermoelectric device and cooling a cold end of the thermoelectric device, and the test system also comprises a test circuit. The test circuit comprises an electronic load which is electrically connected with the output electrode of the thermoelectric device and can instantaneously adjust the resistance value. The test circuit obtains the power generation performance parameters of the thermoelectric device by instantaneously adjusting the resistance value of the electronic load and measuring the currentvalue and the voltage value output by the thermoelectric device under different resistance values. According to the system, the load resistance value is adjusted in a transient state by adopting theelectronic load in the process of testing the generated power of the thermoelectric device, so that temperature difference reduction at two ends of the thermoelectric device caused by a Peltier effectcan be eliminated, the test accuracy is improved, and the test time is shortened.

Description

technical field [0001] The invention relates to the field of thermoelectric conversion technology testing, in particular to a thermoelectric device performance testing system and testing method. Background technique [0002] Thermoelectric devices are usually composed of multiple pairs of p-type and n-type semiconductor material units welded between two ceramic sheets. Using the Seebeck effect, when there is a temperature difference between the two ends of the device, thermal energy can be converted into electrical energy to generate electricity. Conversely, using the Peltier effect, when a thermoelectric device passes current, one end of the device absorbs heat and the other end releases heat, which can realize heat transfer and be used for solid-state refrigeration. Thermoelectric devices are compact in structure, small in size, have no moving parts, no noise, no carbon dioxide and pollutant emissions, can effectively use low-quality heat energy, and have broad application...

Claims

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Application Information

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IPC IPC(8): G01R31/26
CPCG01R31/2601
Inventor 付强吴志敏
Owner SHENZHEN POLYTECHNIC