Instrument integrated debugging and overhauling system and method

An all-in-one, instrument technology, applied in the field of instruments, can solve the problems of inconvenient use of instruments and equipment, low detection and debugging efficiency, etc., and achieve the effect of simple external operation.

Active Publication Date: 2020-08-25
CHINA FIRST METALLURGICAL GROUP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of this, the present invention proposes an instrument integrated debugging and maintenance system and method, aiming to solve the problems of inconvenient use of professional instruments and equipment and low efficiency of testing and debugging for the testing and debugging of existing meters

Method used

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  • Instrument integrated debugging and overhauling system and method
  • Instrument integrated debugging and overhauling system and method
  • Instrument integrated debugging and overhauling system and method

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Embodiment Construction

[0022] Hereinafter, exemplary embodiments of the present disclosure will be described in more detail with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art. It should be noted that the embodiments of the present invention and the features in the embodiments can be combined with each other if there is no conflict. Hereinafter, the present invention will be described in detail with reference to the drawings and in conjunction with the embodiments.

[0023] System embodiment:

[0024] See Figure 1 to Figure 3 , Which is a preferred structure of the instrument integr...

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Abstract

The invention provides an instrument integrated debugging and overhauling system and method. The system comprises a detection basic unit, a change-over switch, an instrument and an interface end; theinterface end is connected with an external control loop; the change-over switch is provided with four gears; when the change-over switch is in the debugging gear, the detection basic unit is connected with the instrument; when the change-over switch is in the maintenance gear, the detection basic unit is connected with the interface end, so that the detection basic unit is connected with the external control loop; when the change-over switch is in a normal use gear, the interface end is connected with the instrument; when the change-over switch is in a neutral gear, the change-over switch isdisconnected with the detection basic unit, the instrument and the interface end. The detection system is designed on the basis of a traditional instrument, so that the instrument has related functions required by debugging and overhauling; external operation is simple; and the problems of long construction time, low efficiency, inconvenience in use and the like of instrument debugging and overhauling in a traditional mode are solved.

Description

Technical field [0001] The present invention relates to the technical field of meters, and in particular to a system and method for integrated debugging and maintenance of meters. Background technique [0002] The meter is usually composed of several electrical components, which can modulate the signal into continuous analog quantity or intermittent digital quantity according to the time domain and frequency domain. It is a tool with complete functions such as measurement, display, recording, control, and alarm. Before the instrument is installed and put into use, a full range of testing and debugging is required to avoid accidents caused by product performance defects. [0003] The debugging process generally needs to test the test control system, the transmission line and the meter itself, including the calibration of the accuracy of voltage, current, frequency, power, etc., and usually use professional instruments and equipment, while the existing instrument debugging equipment ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01D18/00
CPCG01R31/00G01D18/00
Inventor 李锐陶俊韩琪曾一尹传斌顾海文
Owner CHINA FIRST METALLURGICAL GROUP
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