Unlock instant, AI-driven research and patent intelligence for your innovation.

An improved training method based on cmos image data with alternately transformed pulses

A technology of alternate transformation and image data, applied in the field of CMOS image data training, can solve problems such as different relative positions of serial data, unsuccessful word correction stage, unsuccessful channel correction, etc., to reduce load and reduce the number of control signals , the effect of saving resources

Active Publication Date: 2021-08-31
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention solves the problem that the relative position of the serial data intercepted each time in the serial-to-parallel conversion process is different with the change of the ambient temperature in the existing training method of CMOS image data, and then the word correction stage is unsuccessful or the word correction stage is successful but the channel correction occurs. Unsuccessful and other problems, provide an improved training method based on high-resolution and high-frame-rate CMOS image data of alternating pulses

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An improved training method based on cmos image data with alternately transformed pulses
  • An improved training method based on cmos image data with alternately transformed pulses
  • An improved training method based on cmos image data with alternately transformed pulses

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0023] Specific implementation mode 1. Combination Figure 3 to Figure 5 In this embodiment, the improved training method of high-resolution and high-frame-rate CMOS image data based on alternating pulses includes a CMOS data training system, and the CMOS data training system mainly consists of two parts: a CMOS image sensor and a data processor. The data processor includes a programmable delay element (iodelay1), a dedicated serial-to-parallel converter (iserdes1), a data asynchronous FIFO, a control asynchronous FIFO, a data bit width double conversion module (gearbox), and a RAM-based shift register (ram based shifter ) and the controller. As the core of the CMOS data training system, the controller controls the coordination of various parts. Under the control of the controller, the CMOS image sensor outputs serial image data through iodelay1, iserdes1, data asynchronous FIFO, gearbox1:2, ram based shifer, and finally converts it into parallel image data with bit width p. ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An improved training method for CMOS image data based on alternating pulses, involving a training method for CMOS image data, to solve the problem that the serial data intercepted each time during the serial-to-parallel conversion process is relative to the existing CMOS image data training method as the ambient temperature changes. The position is different, and there are problems such as unsuccessful word correction stage or successful word correction stage but channel correction is not successful. Correctness of channel training. In the present invention, in the word correction stage, based on alternately transformed training pulses, only continuous address combinations are selected to obtain correct training words, and a selectable shift register is added before parallel p / 2-bit parallel data to realize controllable The delay of 1 / 2 pixel clock cycle can overcome the training error that may occur in the serial-to-parallel conversion process and the relative position of the serial data intercepted each time due to the change of the ambient temperature.

Description

technical field [0001] The invention relates to a training method for CMOS image data, in particular to a training method for high-resolution and high-frame-frequency CMOS image data based on alternately transformed pulses. Background technique [0002] Nowadays, CMOS image sensors with high resolution (not less than 10k×10k) and high frame rate (not less than 20fps) usually use multiple (not less than 80 channels) high-speed serial channels for image data transmission, each data transmission There is no definite phase relationship between the channels every time they are powered on, which brings great difficulties to the serial-to-parallel conversion of data. Direct use of the internally integrated ISERDES1 module such as virtex 6 cannot meet the requirements of high-bit-width applications, and further serial-to-parallel conversion is required; incorrect data position combinations may occur in the word correction process to obtain correct training words, while channel train...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/374H04N5/376
CPCH04N25/745H04N25/76
Inventor 余达刘金国韩诚山徐东姜肖楠孔德柱周怀得
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI