Clamp de-embedding method and system, storage medium, computer program and application

Abstract

The invention belongs to the technical field of microwave testing, and discloses a clamp de-embedding method and system, a storage medium, a computer program and application, and the method comprisesthe steps: employing a clamp to clamp two different transmission lines, and respectively measuring S parameters [St], i.e. [St1] and [St2], of the whole system; calculating S parameters [St01] and [St02] of the two different sections of transmission lines clamped by the clamp according to a formula; setting an appropriate initial value [S], and approximating the S parameter [S] of the clamp. The comparison between the clamp simulation data and the calculation data finds that the clamp S parameter data at the two ends of the tested piece can be accurately and effectively extracted by adopting the clamp de-embedding method of the double transmission lines, and a good foundation is laid for subsequent semiconductor parameter testing. Compared with a traditional calibration method, the methodhas the advantages of being easy to implement and machine and low in requirement for the machining precision of standard parts, and has good application value.

Description

technical field [0001] The invention belongs to the technical field of microwave testing, and in particular relates to a fixture de-embedding method, system, storage medium, computer program and application. Background technique [0002] At present, in the design and development of microwave circuits, the testing of microwave devices has always been taken seriously. Due to the development of CAD technology, the measurement accuracy requirements of microwave devices are gradually increasing. The port of the automatic network analyzer often cannot be directly connected to the DUT, but needs to pass a specific fixture to measure the DUT. Therefore, the parameters obtained by the microwave network analyzer include information on both the DUT and the fixture. In order to obtain only the accurate parameters of the device under test, it is necessary to perform de-embedding calculations to eliminate the influence of the fixture. [0003] Traditional de-embedding calibration method...

AI Technical Summary

Problems solved by technology

[0004] To sum up, the existing problems in the prior art are: traditional de-embedding and calibration methods require multiple standard calibration parts, which leads to: 1. The calculation method is very complicated , including 8 to 12 error models; 2. The measurement accuracy is directly related to the accuracy of the standard parts, so it puts forward extremely high requirements for the design and processing precision of the calibration parts; 3. Open circuit, short circuit, load calibration parts The processing is difficult and costly, which often brings large parasitic parameters; 4. The calculation error is large and difficult to eliminate

[0005] Difficulties in solving the above technical problems: If the traditional de-embedding and calibration methods are still used, 1. The complexity of the calculation method cannot be solved; 2. The improvement of measurement accuracy and The reduction of error can only be achieved by improving the processing technology and processing precision, which puts forward higher requirements for processing instruments, which cannot be realized in the short term

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