Supercharge Your Innovation With Domain-Expert AI Agents!

A method and device for estimating the IQ imbalance parameter of the originator

A technology that balances parameters and phase unbalance, and is applied to the shaping network, digital transmission system, baseband system components and other directions in the transmitter/receiver. It can solve the problems of system performance degradation, system image interference, and signal-to-noise ratio reduction.

Active Publication Date: 2021-02-26
BEIJING HANNUO SEMICON TECH CO LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The main factors causing the IQ imbalance are: the asymmetry of the analog devices such as the amplifiers through which the I and Q signals pass makes the delays of the two signals different, resulting in an unbalanced IQ delay; the I and Q used for up-conversion The incomplete quadrature of the channel mixing signal causes IQ phase imbalance that is not related to the frequency; the asymmetry of the I channel and Q channel signals passing through the analog devices causes IQ amplitude imbalance
[0003] There are many limitations in the existing transmission IQ imbalance parameter estimation methods, such as: the IQ delay imbalance cannot be estimated, or the above-mentioned three IQ imbalance parameters cannot be estimated at the same time; the carrier frequency deviation is not considered to estimate the IQ imbalance Impact: The estimation method is highly complex and introduces a large resource overhead to the system under test, which is not conducive to system implementation, etc.
Since the IQ imbalance has a great impact on the zero-IF system, it will generate image interference in the system, which will reduce the signal-to-noise ratio, resulting in system performance degradation

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method and device for estimating the IQ imbalance parameter of the originator
  • A method and device for estimating the IQ imbalance parameter of the originator
  • A method and device for estimating the IQ imbalance parameter of the originator

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] The following description and drawings illustrate specific embodiments of the invention sufficiently to enable those skilled in the art to practice them.

[0039] It should be clear that the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0040] When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the present invention. Rather, they are merely examples of apparatuses and methods consistent with aspects of the invention as recited in the appended claims.

[0041] In the descriptio...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention discloses a method and device for estimating IQ imbalance parameters at the sending end. The method includes: using the transmitter of the device under test to send out a frequency sweep signal; collecting the frequency sweep signal to obtain a frequency sweep receiving signal; calculating the The real part and the imaginary part correlation value of each frequency scanning frequency point time domain signal in the frequency scanning received signal, the correlation value comprises a real part autocorrelation value, an imaginary part autocorrelation value and a real part imaginary part cross correlation value; based on the Real part and imaginary part correlation values ​​are calculated to generate the sending end IQ imbalance parameters of the device under test, and the sending end IQ imbalance parameters include IQ delay imbalance parameters, IQ phase imbalance parameters and IQ amplitude imbalance parameters. Therefore, the system performance can be improved by adopting the embodiment of the present application.

Description

technical field [0001] The invention relates to the field of digital communication, in particular to a method and device for estimating an IQ imbalance parameter at a sending end. Background technique [0002] During the up-conversion process of the digital communication system using the zero-IF radio frequency solution, due to the non-ideality of the analog devices used, IQ imbalance will be introduced to the system. The main factors causing the IQ imbalance are: the asymmetry of the analog devices such as the amplifiers through which the I and Q signals pass makes the delays of the two signals different, resulting in an unbalanced IQ delay; the I and Q used for up-conversion The incomplete quadrature of the channel mixing signal causes IQ phase imbalance that is not related to the frequency; the asymmetry of the I channel and Q channel signals passing through the analog devices causes IQ amplitude imbalance. [0003] There are many limitations in the existing method for e...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04L25/03H04L27/00
CPCH04L25/03159H04L25/03178H04L25/03343H04L27/0014H04L2027/0026
Inventor 吕毅赵辉张诚
Owner BEIJING HANNUO SEMICON TECH CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More