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Ferroelectric random access memory word line driver, decoder, and related circuit

A word line driver and decoder technology, applied in the decoder field, can solve the problems of increasing the size of the bootstrap capacitor, high word line transistor ratio, large chip area, etc.

Inactive Publication Date: 2020-09-22
WUXI PETABYTE TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In other words, conventional wordline drivers usually occupy a relatively large area of ​​the chip, and the ratio of transistors to wordlines is relatively high
Also, a large transistor load will increase the size of the bootstrap capacitor used for wordline boost due to the larger capacitive load

Method used

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  • Ferroelectric random access memory word line driver, decoder, and related circuit
  • Ferroelectric random access memory word line driver, decoder, and related circuit
  • Ferroelectric random access memory word line driver, decoder, and related circuit

Examples

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Embodiment Construction

[0038] While specific configurations and arrangements are discussed, it should be understood that this discussion is for illustration purposes only. It will be appreciated by those skilled in the art that other configurations and arrangements may be used without departing from the spirit and scope of the present disclosure. It will be apparent to those skilled in the art that the present disclosure can be used in a variety of other applications as well.

[0039] It should be noted that references in this specification to "one embodiment", "an embodiment", "exemplary embodiment", "some embodiments" and the like mean that the described embodiments may include specific features, structures, or characteristics, but not every embodiment necessarily includes that particular feature, structure or characteristic. Moreover, such expressions do not necessarily refer to the same embodiment. Furthermore, when a particular feature, structure or characteristic is described in conjunction ...

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PUM

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Abstract

A word line driver may include: a first transistor having a first node at an input and a second node at an input voltage; a second transistor having a first node at the input node, a second node at athird node of the first transistor, and a grounded third node; a third transistor having a first node at the input voltage, a second node at the first internal node, and a third node at the second internal node; a fourth transistor having a first node at an internal node, a second node at a boosted voltage, and a third node at a word line; a fifth transistor having a first node at an internal node, a second node at a word line, and a grounded third node; and a sixth transistor between the word line, the boosted voltage, and the second internal node.

Description

Background technique [0001] Embodiments of the present disclosure relate to decoders. Certain embodiments may more particularly relate to random access memory (RAM) circuits as ferroelectric random access memory (FRAM) word line decoders. [0002] A memory device may consist of circuitry configured to store logic states. These logical states can be stored in volatile or non-volatile fashion. While flash RAM has become a popular volatile choice for bit storage, ferroelectric RAM (FRAM) promises lower power usage, faster write performance, and greater maximum read / write endurance . FRAM is one of several alternatives to flash RAM. Another alternative is dynamic RAM (DRAM). DRAM and FRAM may be different from each other. Similar to DRAM, FRAM relies on a destructive read process, requiring a read-after-write architecture. Unlike DRAM, FRAM is a non-volatile memory technology. Therefore, FRAM has its own unique challenges and problems. [0003] Bits can be stored as logic...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C11/22
CPCG11C11/2257G11C11/2253G11C11/2297G11C8/08G11C8/10G11C11/221H10B53/40G11C7/1078G11C7/12H10B51/00
Inventor 潘锋
Owner WUXI PETABYTE TECH CO LTD
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