Tool abnormal placement detection method and system based on double-index metric learning
A technology for metric learning and detection methods, applied in the field of image processing, can solve the problems of error-prone cost, low degree of automation, low efficiency, etc., and achieve the effect of avoiding time-consuming problems
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[0036] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. For the step numbers in the following embodiments, it is only set for the convenience of illustration and description, and the order between the steps is not limited in any way. The execution order of each step in the embodiments can be adapted according to the understanding of those skilled in the art sexual adjustment.
[0037] The present invention improves the existing metric learning network structure in the field of deep learning—relational network structure, and uses the improved model as a tool abnormal placement detection model. The model uses the lightweight MobileNetV2 network structure as the feature extraction network to improve the speed of model training and testing; it uses a three-layer convolutional neural network to automatically learn the similarity between two pictures. Based on the existing relationship network mo...
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