Eddy current sensor probe sensitivity and linearity optimization method and system

An eddy current sensor and optimization method technology, applied in design optimization/simulation, instruments, special data processing applications, etc., can solve problems such as large amount of calculation and difficult probe design, and achieve the effect of overcoming large amount of calculation.

Pending Publication Date: 2020-11-10
北京中科九微科技有限公司
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Therefore, the method and system for optimizing the sensitivity and linearity of an eddy current sensor probe provided by the present invention overcome the defects of large amount of calculation and difficult probe design in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Eddy current sensor probe sensitivity and linearity optimization method and system
  • Eddy current sensor probe sensitivity and linearity optimization method and system
  • Eddy current sensor probe sensitivity and linearity optimization method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0043] A method for optimizing the sensitivity and linearity of an eddy current sensor probe provided in an embodiment of the present invention, such as figure 1 shown, including the following steps:

[0044] Step S1: Obtain multiple influencing factors affecting the sensitivity and linearity of the eddy current sensor probe.

[0045] In the embodiment of the present invention, the influencing factors include: at least one of the inner and outer radii of the sensor probe coil, the diameter of the enameled wire, and the thickness of the coil. This is just an example and not limited thereto. In practical applications, select the corresponding influence according to actual needs. factors, the embodiment of the present invention optimizes the sensitivity and linearity of the eddy current sensor probe by optimizing the coil.

[0046] Step S2: According to the requirements of sensitivity and linearity within the preset measuring range of the eddy current sensor, determine the influen...

Embodiment 2

[0061] An embodiment of the present invention provides an eddy current sensor probe sensitivity and linearity optimization system, such as image 3 shown, including:

[0062] The factor obtaining module 11 is used to obtain multiple influencing factors affecting the sensitivity and linearity of the eddy current sensor probe; this module executes the method described in step S1 in Embodiment 1, which will not be repeated here.

[0063] Influence level determining module 12 is used to determine the influence level of each influencing factor according to the requirements of sensitivity and linearity in the preset range of the eddy current sensor; this module executes the method described in step S2 in Embodiment 1, and is not described Let me repeat.

[0064] Orthogonal test scheme determination module 13 determines the orthogonal test scheme according to the orthogonal test and the influence level of each influencing factor; this module executes the method described in step S3 ...

Embodiment 3

[0071] An embodiment of the present invention provides a terminal, such as Figure 4 As shown, it includes: at least one processor 401 , such as a CPU (Central Processing Unit, central processing unit), at least one communication interface 403 , memory 404 , and at least one communication bus 402 . Wherein, the communication bus 402 is used to realize connection and communication between these components. Wherein, the communication interface 403 may include a display screen (Display) and a keyboard (Keyboard), and the optional communication interface 403 may also include a standard wired interface and a wireless interface. The memory 404 may be a high-speed RAM memory (Random Access Memory, volatile random access memory), or a non-volatile memory (non-volatile memory), such as at least one disk memory. Optionally, the memory 404 may also be at least one storage device located away from the aforementioned processor 401 . The processor 401 can execute the method for optimizing...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Sensitiveaaaaaaaaaa
Login to view more

Abstract

The invention discloses an eddy current sensor probe sensitivity and linearity optimization method and system, and the method comprises the steps: obtaining a plurality of impact factors affecting thesensitivity and linearity of an eddy current sensor probe, determining the impact level of each impact factor, determining an orthogonal test scheme according to an orthogonal test and the impact level of each impact factor; after all the probes required by the orthogonal test are tested, calculating the sensitivity and linearity of each probe in a preset range, determining important factors in the influence factors by utilizing a preset algorithm, and when the influence level of the important factors of the probes meets a preset condition, determining a probe numerical value meeting the sensitivity requirement; and based on the probe numerical value meeting the sensitivity requirement and other influence factors, determining the optimal linearity probe meeting the linearity requirement,wherein the other influence factors are influence factors except important factors. An orthogonal experiment is utilized, the optimal linearity is found according to certain sensitivity, and an instructive effect on manufacturing of the probe is achieved.

Description

technical field [0001] The invention relates to the technical field of eddy current sensor probe optimization, in particular to an eddy current sensor probe sensitivity and linearity optimization method and system. Background technique [0002] As a non-destructive and non-contact displacement sensor, the eddy current sensor has the characteristics of simple structure, low cost, high reliability, high sensitivity, etc., and has unique advantages such as high tolerance to harsh environments. It is not only widely used in various rotating machinery The vibration measurement of the rotor can also convert non-displacement quantities, such as speed, pressure, angle, angular velocity and other mechanical quantities, into electrical parameters for measurement. [0003] The eddy current sensor is mainly composed of a skeleton, a coil and a processing circuit. The probe coil is an important part of the eddy current sensor, and its geometric size is closely related to the sensitivity,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01D18/00G06F30/20
CPCG01D18/00G06F30/20
Inventor 陈林任世瑜张亮罗珂刘强
Owner 北京中科九微科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap