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Abnormality test method, device and system for intelligent terminal

An anomaly testing and smart terminal technology, applied in testing and financial fields, can solve the problems of low efficiency of smart terminal testing, inability to test whether there are abnormalities in smart terminals, and high labor costs, so as to reduce repetitive testing work, improve test quality and Efficiency, the effect of improving work quality and efficiency

Pending Publication Date: 2020-11-10
INDUSTRIAL AND COMMERCIAL BANK OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the existing technology cannot effectively test whether there is an abnormality in the smart terminal, the testing efficiency of the smart terminal is not high, and the labor cost is too high

Method used

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  • Abnormality test method, device and system for intelligent terminal
  • Abnormality test method, device and system for intelligent terminal
  • Abnormality test method, device and system for intelligent terminal

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Embodiment Construction

[0026] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiment is one embodiment of the present invention, but not all embodiments of the present invention. Based on the described embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0027] Unless otherwise defined, the technical terms or scientific terms used in the present invention shall have the usual meanings understood by those skilled in the art to which the present invention belongs.

[0028] The embodiment of the present invention firstly provides an abnormality testing method of an intelligent terminal, figure 1 ...

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Abstract

The invention relates to an abnormality test method, an exception test device and an exception test system for an intelligent terminal, which are applied to finance or other fields, the method comprises the following steps: acquiring a comparison terminal screenshot of a comparison terminal, obtaining a to-be-tested screenshot, corresponding to the comparison terminal screenshot, of each to-be-tested terminal in at least one to-be-tested terminal; comparing the similarity between the comparison terminal screenshots and each screenshot to be tested; and outputting corresponding abnormal condition information of the to-be-tested terminal according to the similarity. According to the abnormality test method of the intelligent terminal, the abnormality test device of the intelligent terminal and the abnormality test system of the intelligent terminal, through the similarity obtained through comparison, whether the intelligent terminal is abnormal or not can be effectively tested, the testefficiency of the intelligent terminal is high, the abnormality condition information of the corresponding terminal to be tested is output, a tester can conveniently and visually find problems, and the labor cost is reduced.

Description

technical field [0001] The present invention relates to the fields of finance and testing technology, in particular to an abnormality testing method, device and system of an intelligent terminal. Background technique [0002] With the popularization of smart terminals, various problems may occur in smart terminals, especially there are more and more application software at present. Before the application software is promoted to the market or after it is updated, smart terminals are more likely to have various problems, so Smart terminals need to be tested. However, the existing technology cannot effectively test whether there is an abnormality in the smart terminal, the test efficiency of the smart terminal is not high, and the labor cost is too high. Contents of the invention [0003] In view of the above problems, the present invention is proposed to provide a method, device and system for abnormality testing of smart terminals that overcome the above problems or at lea...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06K9/62G06F11/22H04M1/24H05B45/20H05B45/325
CPCG06T7/001G06F11/2273H04M1/24H05B45/20H05B45/325G06F18/22
Inventor 徐林张涛谷丽雅
Owner INDUSTRIAL AND COMMERCIAL BANK OF CHINA
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