Phase deflection technology photoelectric imaging quality evaluation method
A technology for photoelectric imaging and quality evaluation, applied in measurement devices, image enhancement, image analysis, etc., can solve the problem of no quantitative and effective imaging quality evaluation method, avoid building rework, reduce dimensions, and reduce time-consuming Effect
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[0020] The present invention will now be described in further detail in conjunction with the accompanying drawings and preferred embodiments. These drawings are all simplified schematic diagrams, which only illustrate the basic structure of the present invention in a schematic manner, so they only show the configurations related to the present invention.
[0021] like figure 1 As shown, a phase deflection photoelectric imaging quality evaluation method, the imaging structure includes an area array camera, a projection device and a standard object to be measured.
[0022] The method includes: using the projection device in the phase deflection system to project the sinusoidal fringe image used for detection to the standard measured object, and then the camera shoots the image of the standard measured object with the projected fringes, wherein the surface of the standard measured object is horizontal and long , width, and reflectivity are all close to the actual measured object...
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