Quality evaluation method of photoelectric imaging by phase deflection technique
A photoelectric imaging and quality evaluation technology, applied in image analysis, image enhancement, measuring devices, etc., can solve the problems of no quantitative and effective imaging quality evaluation methods, avoid rework of construction, reduce dimensions, and reduce time-consuming Effect
Active Publication Date: 2020-12-29
BEIJING FOCUSIGHT TECH +1
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[0006] The technical problem to be solved by the present invention is: to provide a method for evaluating the photoelectric imaging quality of phase deflection technique, to solve the problem that there is no quantitative and effective imaging quality assessment method for phase deflection technique in the imaging stage, which leads to the necessity of final detection Questions that result in evaluation criteria
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[0020] The present invention will now be described in further detail in conjunction with the accompanying drawings and preferred embodiments. These drawings are all simplified schematic diagrams, which only illustrate the basic structure of the present invention in a schematic manner, so they only show the configurations related to the present invention.
[0021] Such as figure 1 As shown, a phase deflection photoelectric imaging quality evaluation method, the imaging structure includes an area array camera, a projection device and a standard object to be measured.
[0022] The method includes: using the projection device in the phase deflection system to project the sinusoidal fringe image used for detection to the standard measured object, and then the camera shoots the image of the standard measured object with the projected fringes, wherein the surface of the standard measured object is horizontal and long , width, and reflectivity are all close to the actual measured obj...
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The invention relates to a phase deflection technology photoelectric imaging quality evaluation method. A projection device in the phase deflection system is used for projecting a sine fringe image used during detection to a standard detected object, a standard detected object image with projection stripes is shot by a camera, the standard detected object image is processed through an algorithm, the score of the imaging quality is obtained, the higher the score is, the higher the imaging quality is, and finally the better the detection effect of the actual detected object is. According to themethod, photoelectric system construction rework is avoided, dimensionality of detection problem positioning is reduced, and time consumption of phase deflection system debugging is reduced; in the stage of building the photoelectric system, when the photoelectric system needs to be adjusted, the photoelectric system is adjusted through the imaging quality evaluation standard till the imaging quality meets the standard, and the imaging quality is guaranteed, so the photoelectric system can reach an ideal state in the building stage, and imaging quality factors are eliminated in the positioningaspect of problems (unsatisfactory detection results) in the subsequent detection stage.
Description
technical field [0001] The invention relates to the technical field of visual imaging detection, in particular to a method for evaluating the quality of photoelectric imaging by phase deflection technique. Background technique [0002] Phase measurement deflectometry is based on the principle of phase detection to obtain object information. The projection device projects N+8 (N generally takes 18) structured light stripes to the object to be tested in sequence, of which N / 2 gray code stripes are horizontal and vertical, 4 sinusoidal stripes are horizontal and vertical, and the structured light is projected onto the surface of the object to be measured. The gradient change at the defect of the measured object causes the phase of the structured light to change, resulting in the deformation of the stripes. The CCD camera records the deformed structured light, and then obtains the phase information from the 26 frames of light intensity images. The camera takes pictures and trans...
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IPC IPC(8): G01B11/25G06T7/00G06T7/70G06T7/80
CPCG01B11/254G06T7/0002G06T2207/30168G06T2207/30244G06T7/70G06T7/80
Inventor 都卫东王岩松和江镇吴健雄王天翔
Owner BEIJING FOCUSIGHT TECH