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One-stop intelligent defect detection system

A defect detection, one-stop technology, applied in the direction of optical testing flaws/defects, measuring devices, material analysis through optical means, etc., can solve the problems of staying in manual naked eye detection and poor versatility of detection tools

Active Publication Date: 2020-11-13
BEIJING ZODNGOC AUTOMATIC TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, most of the demand market share of defect detection is distributed in the field of industrial production. The defect detection of most industries in the field of industrial production is still in the stage of manual naked eye detection, which makes enterprises need to invest a lot of manpower, material resources and financial resources to ensure the delivery of products. quality
At present, most of the mainstream visual defect detection systems in the market use complex defect detection tools to implement combined and superimposed detection methods; or develop special detection tools for a single industry, and the detection tools have poor versatility

Method used

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0073] Such as figure 1 As shown, the one-stop intelligent defect detection system includes:

[0074] The image acquisition part is composed of a camera, a lens, and a photonics subsystem. The image acquisition part is used to collect the original image of the inspected material; it can collect the original image of the inspected material with high quality and high contrast.

[0075] The intelligent mode adaptive part is realized by the detection mode adaptive algorithm. The detection mode adaptive algorithm realizes the closed-loop control by constructing the defect detection result quality evaluation function, and realizes intelligent selection and switching of detection modes for different materials to be detected.

[0076] The one-stop defect detection part is realized by the one-stop defect detection algorithm, which is used to realize all defect types and defect location information covered by the camera field of view; at the same time, the one-stop defect detection alg...

Embodiment 2

[0082] The operation process of the one-stop intelligent defect detection system includes the following steps:

[0083] Step 1. Collect several images of good products;

[0084] Step 2. Collect several images of defective products;

[0085] Step 3. Online deployment of defect detection starts, and the intelligent mode adaptive part intelligently matches the detection mode through the good product image and the defective product image;

[0086] Step 4. One-stop normal defect detection, parallel computing acceleration;

[0087] Step 5, storing defect detection results and sending detection information to the control part;

[0088] Step 6, the control part receives the detection information, and sends a related control signal;

[0089] Step 7, the defect identification execution part receives the control signal from the control part, and makes corresponding execution actions.

[0090] Among them, the execution part of defect identification can specifically be a cylinder with ...

Embodiment 3

[0092] The realization of the one-stop defect detection algorithm:

[0093] The one-stop defect detection algorithm can select different detection modes to adapt to inspected materials of different materials. The detection mode adaptive algorithm can independently select the optimal detection mode. The parallel acceleration algorithm module provides a powerful one-stop defect detection algorithm. computational support.

[0094] Since the image acquisition part is determined, the acquired image resolutions are consistent, and the image resolution (height, width) involved in the one-stop defect detection algorithm must be consistent, otherwise the normal defect detection cannot be performed; if the actual application, the acquisition If the resolutions of the images are not consistent, then the advanced resolution will be converted uniformly and then the defect detection will be carried out. The method is as follows:

[0095] ,

[0096] ,

[0097] in, is the height of t...

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Abstract

The invention relates to a one-stop intelligent defect detection system. The system comprises an image acquisition part, an intelligent mode adaptive part, a one-stop defect detection part, a parallelacceleration part, a defect storage part, a communication part, a control part and a defect identification execution part. According to the system, all defect types covered in a visual field range can be detected in a one-stop manner, and position information of a defect area is given, and a complex defect detection tool is not needed to be used for combination and superposition type defect detection means; self-adaptive detection mode matching can be carried out according to the material quality of the detected material and the detection requirement so as to achieve the optimal defect detection effect; the one-stop defect detection algorithm is suitable for parallel acceleration calculation, and by introducing a parallel acceleration part, one-stop online, rapid and real-time defect detection can be easily carried out; the one-stop defect detection algorithm has very strong robustness to environmental factors such as illumination conditions and the like; and an environmental problemof the most painful point of industrial vision detection is illumination.

Description

technical field [0001] The invention relates to a one-stop intelligent defect detection system, which belongs to the technical field of intelligent defect detection. Background technique [0002] At present, most of the demand market share of defect detection is distributed in the field of industrial production, and the defect detection of most industries in the field of industrial production is still in the stage of manual naked eye detection, which makes enterprises need to invest a lot of manpower, material resources and financial resources to ensure the delivery of products quality. At present, most of the mainstream visual defect detection systems in the market use complex defect detection tools to implement combined and superimposed detection methods; or develop special detection tools for a single industry, and the detection tools have poor versatility. [0003] Therefore, this patent proposes a one-stop intelligent defect detection system, which can perform intellig...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
CPCG01N21/88G01N21/8851G01N2021/8887
Inventor 郑秀征叶振飞王英利冯龙申梁长国朱超平
Owner BEIJING ZODNGOC AUTOMATIC TECH
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