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Detection device for semiconductor

A detection device and semiconductor technology, applied in measuring devices, material analysis through optical means, instruments, etc., can solve the problems of poor connection between the cover plate and the bottom plate, entering the market, and deviation of test results, so as to improve practicability and facilitate detection , the effect of improving work efficiency

Inactive Publication Date: 2020-12-18
广州正心科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] A semiconductor is a substance whose conductivity is between an insulator and a conductor. Its conductivity is easy to control and can be used as a component material for information processing. Semiconductor materials are mostly used in the manufacture of chips. With the development of microelectronics technology, the weight is lighter, Chip technology with smaller size and high reliability is gradually being widely used. QFN is such a newer package form. It belongs to the device without lead package, and the size is very small. The common ones are 3*3mm and 4*4mm. , 5*5mm, 6*6mm, etc. The abdomen of the package usually has a grounding heat dissipation pad, and there are conductive pads around it for electrical connection. The number is usually 20, 24, 32, etc.; in the production of QFP packaged integrated circuits In the process, it is necessary to test the QFP packaged integrated circuit to avoid unqualified products from entering the market; the detection device in the prior art directly closes the cover plate and the bottom plate to detect the QFP packaged integrated circuit, and the connection between the cover plate and the bottom plate is poor, so it cannot be compared. Accurate detection of QFP packaged integrated circuits affects the precise contact between electrodes and pins, resulting in deviations in test results

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  • Detection device for semiconductor
  • Detection device for semiconductor
  • Detection device for semiconductor

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Embodiment Construction

[0059] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0060] see Figure 1-5 , the present invention provides a technical solution: a detection device for semiconductors, including a base plate 1, a support plate 2 is fixedly connected to the upper surface of the base plate 1, a detection seat 3 is fixedly connected to the upper surface of the support plate 2, and the left and right sides of the back of the detection seat 3 Both are provided with a first fixed block 4, the inner surface of the first fixed block 4...

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Abstract

The invention relates to the technical field of semiconductors, and discloses a semiconductor detection device. The device comprises a bottom plate, a supporting plate is fixedly connected to the upper surface of the bottom plate, a detection seat is fixedly connected to the upper surface of the supporting plate, and first fixed blocks are arranged on the left side and the right side of the back surface of the detection seat; the inner side surface of each first fixed block is fixedly connected with a first rotating shaft, the outer surface of the first rotating shaft is sleeved with a secondfixed block, the upper surface of the second fixed block is fixedly connected with a cover plate, and the front surface of the detection seat is provided with a locking device. According to the detection device for the semiconductor, through the arrangement of the fixed shaft, the second fixed block, the spring and the connecting shaft, the locking rod can conveniently and stably lock the fixing rod, so the cover plate and the detection seat can be stably and effectively driven to be connected, and the detection seat and the cover plate can accurately detect a QFP packaging integrated circuit,so the problem of deviation of a test result is effectively avoided.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a detection device for semiconductors. Background technique [0002] A semiconductor is a substance whose conductivity is between an insulator and a conductor. Its conductivity is easy to control and can be used as a component material for information processing. Semiconductor materials are mostly used in the manufacture of chips. With the development of microelectronics technology, the weight is lighter, Chip technology with smaller size and high reliability is gradually being widely used. QFN is such a newer package form. It belongs to the device without lead package, and the size is very small. The common ones are 3*3mm and 4*4mm. , 5*5mm, 6*6mm, etc. The abdomen of the package usually has a grounding heat dissipation pad, and there are conductive pads around it for electrical connection. The number is usually 20, 24, 32, etc.; in the production of QFP packaged integrat...

Claims

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Application Information

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IPC IPC(8): G01N21/3581G01N21/01
CPCG01N21/01G01N21/3581
Inventor 黄静怡
Owner 广州正心科技有限公司