Digital processing module test method and device, computer equipment and storage medium

Abstract

The invention provides a digital processing module test method and apparatus, a computer device and a storage medium, and belongs to the field of automatic hardware testing, and the method comprises the steps of obtaining a preset selection interface diagram and interface connection data of a digital processing module; extracting interface information from the interface connection data, and generating digital interface options and performance parameter options corresponding to the interface information according to the interface information; displaying a digital interface option and a performance parameter option in the selection interface diagram; generating a test instruction according to the selected digital interface option and performance parameter option, and sending the test instruction to a digital processing module; receiving a performance test result which is fed back by the digital processing module and corresponds to the test instruction; and inputting the performance testresult into a pre-constructed fault tree model, and outputting interface operation information corresponding to the digital processing module. Through the processing scheme disclosed by the invention,modeling is carried out on the digital processing module, disassembly of system complexity is realized, and functional diagnosis and data acquisition of the digital processing module are realized.

Description

technical field [0001] The invention relates to the field of hardware automatic testing, in particular to a digital processing module testing method, device, computer equipment and storage medium. Background technique [0002] With the increasing demand for digital signal processing, the traditional single DSP digital signal processing module or FPGA digital processing module can no longer meet the current processing requirements, and more and more heterogeneous processing modules are applied to high-throughput, high-bandwidth processing scenarios middle. However, as the integration of digital processing modules is getting higher and higher, the difficulty of testing digital processing modules is also greatly increased. The coupling between processors in heterogeneous digital processing modules makes the testing of digital processing modules no longer a simple system of a single discipline. . For the current mainstream testing method of heterogeneous digital processing mod...

AI Technical Summary

Problems solved by technology

[0003] However, such a testing process and method has the following defects: the description of the test description is not clear, the test engineer cannot effectively read the test manual, and the designer needs to conduct separate training and on-site explanation; the test process requires personnel to be stationed and record data, and the utilization rate of personnel is low; Test engineers cannot effectively locate faults, requiring designers to reproduce faults and locate faults

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