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Index analysis method and device for standard cell library

A technology of standard cell library and standard cell, which is applied in the field of standard cell library index analysis methods and devices, can solve the problems of long R&D cycle and low R&D efficiency, and achieve the effect of improving efficiency and shortening R&D cycle

Active Publication Date: 2020-12-29
HYGON INFORMATION TECH CO LTD
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  • Abstract
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Problems solved by technology

[0004] The purpose of the embodiment of the present application is to provide an index analysis method and device of a standard cell library to solve the problems of long research and development cycle and low research and development efficiency in the prior art

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  • Index analysis method and device for standard cell library
  • Index analysis method and device for standard cell library
  • Index analysis method and device for standard cell library

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Embodiment Construction

[0029] The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application.

[0030] In order to facilitate the understanding of the technical solution of the present application, related concepts involved will be explained below.

[0031] Standard units, including inverters, AND gates, registers, selectors, full adders and other basic units, each standard unit corresponds to multiple unit circuits with different sizes (W / L) and different drive capabilities, and different Drive strength circuits are all integer multiples of the base or minimum size.

[0032] Standard cell library, including layout library, symbol library, circuit logic library, etc. Contains combinational logic, sequential logic, functional units, and special type units. It is a basic part in the back-end design process of integrated circuit chips. Using pre-designed optimized library cells for automatic l...

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Abstract

The invention provides an index analysis method and device for a standard cell library. The method comprises the steps of obtaining an attribute information file and first use statistical informationcorresponding to a to-be-analyzed standard cell library, wherein the to-be-analyzed standard cell library comprises a plurality of types of standard cells, and the first use statistical information comprises a quantity ratio corresponding to each standard unit, an area utilization rate after layout and wiring and a logic stage number corresponding to a target path; performing feature extraction onthe attribute information file to obtain a plurality of pieces of first attribute information corresponding to each standard unit; and analyzing the to-be-analyzed standard cell library according tothe first attribute information and the first use statistical information corresponding to each standard cell to obtain a first index feature corresponding to the to-be-analyzed standard cell library.According to the embodiment of the invention, in the design stage, the indexes of the to-be-analyzed standard cell library are reflected according to the first index characteristics, and corresponding products do not need to be produced, so that the research and development period is shortened, and the research and development efficiency is improved.

Description

technical field [0001] The present application relates to the technical field of integrated circuits, in particular, to an index analysis method and device for a standard cell library. Background technique [0002] The standard cell library is one of the basic data supporting the automation process of digital integrated circuit design. The standard cell library supports the entire integrated circuit automation design process from front-end function simulation to back-end layout realization. [0003] In integrated circuit design, in the initial research and development stage of the product, it is necessary to evaluate the relevant indicators of the newly developed standard cell library to analyze the performance, power consumption and area that the product may have after it is produced. In the prior art, after the product is produced, the test case is used to test the product, so as to obtain the corresponding index. If the indicators do not meet expectations, it is necessar...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/398G06F30/33G06F119/06
CPCG06F30/398G06F30/33G06F2119/06Y02D10/00
Inventor 陈权
Owner HYGON INFORMATION TECH CO LTD
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