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Test board for CDSS LCD computer performance testing

A technology of computer and test bench, which is applied in the field of test bench for CDSSLCD computer performance test, can solve the problems of low test efficiency and poor effect, and achieve the effect of improving efficiency and accurate measurement results

Pending Publication Date: 2021-01-08
SICHUAN HAITE HIGH TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the prior art, there is no supporting test bench specially used for testing the CDSS LCD computer. When testing it, the prior art often needs to use various conventional test equipment for splicing, and select a combination of multiple equipment to realize the test. The preparation of power supply and various signals required for CDSS LCD computer test, the test efficiency is low, and the effect is not good

Method used

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  • Test board for CDSS LCD computer performance testing
  • Test board for CDSS LCD computer performance testing
  • Test board for CDSS LCD computer performance testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0039] Present embodiment proposes a kind of test platform for CDSS LCD computer performance test, as figure 1 As shown, the test is connected with an external power supply and a CDSS LCD computer, including a chassis, a panel arranged on the chassis, and an internal circuit arranged in the chassis, and the internal circuit is respectively connected to the external power supply, the CDSS LCD computer connection;

[0040] The internal circuitry includes:

[0041] The power interruption control circuit, discrete input circuit, discrete output circuit, video signal input circuit, video signal output circuit, socket XS1, plug XP1 output circuit, video signal input circuit, and video signal output circuit pass through the matching socket XS1 Connect with plug XP1 to the tested CDSS LCD computer;

[0042] The power interruption control circuit is also connected to a 28V DC external power supply.

[0043] Working principle: The test bench is mainly composed of power supply and pow...

Embodiment 2

[0049] This embodiment is on the basis of above-mentioned embodiment 1, in order to realize the present invention better, as figure 2 As shown, further, the discrete input circuit includes an interface J1, an interface J2, a double pole switch S1, a button switch S2, a button switch S3, a button switch S4, a button switch S5, and a button switch S6 , button switch S7, button switch S19, resistor R1, light emitting diode VB5;

[0050] The input ends of the interface J1 and the interface J2 are respectively connected to the +28V DC external power supply and the -28V DC external power supply, and the output end of the interface J1 is connected with the resistor R1 and the light-emitting diode VB5 after being connected with the one-pole switch of the double-pole button switch S1. Connection; after the interface J1 is connected with the light-emitting diode VB5, it will converge with the interface J2 of another switch connected with the double-pole button switch S1, and then conne...

Embodiment 3

[0054] This embodiment is based on any one of the above-mentioned embodiments 1-2, such as figure 2 As shown, in order to better realize the present invention, further, the power interruption control circuit includes MOS transistor Q1, resistor R12, 28V DC / 5V DC step-down chip U1, NE555 chip U2, 4N26 chip U3, resistor R6, resistor R7, resistor R8, resistor R9, resistor R10, resistor R11, capacitor C1, capacitor C2, capacitor C3, switch S20;

[0055] The source of the MOS transistor Q1 is connected to the 28V power supply, the drain is connected to the CDSS CURRENT+ interface, and the socket XS1 is connected to the CDSS CURRENT- interface with terminals 24 and 25, and the gate of the MOS transistor Q1 is connected to the resistor R11. Resistor R11 is connected to No. 5 terminal of 4N26 chip U3; No. 4 terminal of 4N26 chip U3 is grounded, and No. 1 terminal of 4N26 chip U3 is connected to resistor R9 and connected to the 5V power supply of 28V DC / 5V DC step-down chip U1 The ou...

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PUM

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Abstract

The invention provides a test board for CDSS LCD computer performance testing. The test board is connected with an external power supply and a CDSS LCD computer so as to perform testing and comprisesa case, a panel arranged on the case and an internal circuit arranged in the case, wherein the internal circuit is connected with the external power supply and the CDSS LCD computer through a plurality of interfaces arranged on the panel; the internal circuit comprises a power supply interruption control circuit, a discrete magnitude input circuit, a discrete magnitude output circuit, a video signal input circuit, a video signal output circuit, a socket XS1 and a plug XP1; the discrete magnitude output circuit, the video signal input circuit and the video signal output circuit are connected with a tested CDSS LCD computer through the matched socket XS1 and plug XP1; the power supply interruption control circuit is connected with a 28V DC external power supply. By means of the arrangement,accurate and efficient testing work is achieved.

Description

technical field [0001] The invention belongs to the technical field of machine performance testing, and in particular relates to a test bench for CDSS LCD computer performance testing. Background technique [0002] CDSS LCD computer is the abbreviation of COCKPIT DOOR SURVEILLANCE SYSTEM, which is "cockpit door monitoring system". The CDSS LCD computer is the display / computer component in the "cockpit door monitoring system". CDSS LCD computers consist of a display integrated with a controller, the computer is integrated into a liquid crystal display (LCD) housing, and contains the video circuit board and power board. CDSS LCD computer provides live video from the aircraft cockpit door entrance area to the cabin. [0003] In the prior art, there is no supporting test bench specially used for testing the CDSS LCD computer. When testing it, the prior art often needs to use various conventional test equipment for splicing, and select a combination of multiple equipment to rea...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G02F1/13G09G3/00
CPCG01R31/008G02F1/1309G09G3/006
Inventor 龚尚权王祖兴覃定华徐德军
Owner SICHUAN HAITE HIGH TECH CO LTD