Sensing techniques for a memory cell
A technology of memory cells and latches, which is applied in the field of sensing technology for memory cells, and can solve the problems of extra cost and manufacturing complexity, increasing the size or occupied area of memory devices, etc.
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[0019] A memory device may perform one or more sensing operations on a memory cell in order to sense or read the logic state of the memory cell (eg, via one or more components of the memory device). For example, during a read operation, a memory cell may be coupled to a sensing element (eg, a latch) via a transistor in a source follower configuration (eg, by activating a word line and a cascode). The sensing component can sense the state of the memory cell by comparing a voltage signal associated with the memory cell with a reference voltage (eg, by latching or triggering the voltage signal and the reference signal). In some cases, a first voltage associated with a memory cell may be boosted to a second voltage, and then the second voltage may be shifted to a third voltage (eg, a voltage lower than the second voltage) before being sensed by the sensing component. ). Boosting and shifting may enable the third voltage to produce a usable signal, and may enable the third voltage...
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