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Wheat growth period field aphid resistance screening and identifying device

A growth period, anti-aphid technology, applied in the fields of grain cultivation, animal husbandry, etc., can solve the problems of unrepresentative indoor identification results, difficulty in accurately reflecting the real resistance level of materials, and changing the growth conditions of wheat and aphids, so as to ensure Authenticity, outstanding practicability, and time-shortening effects

Pending Publication Date: 2021-01-22
HENAN UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The aphid resistance of wheat materials and varieties was screened and evaluated by methods such as aphid mass ratio. However, the field test was affected by many environmental factors such as wind and rain, so the results could not accurately reflect the real resistance level of the materials.
Although the indoor experiment effectively avoided environmental influences such as wind and rain, the growth conditions of wheat and aphids were artificially changed.
Because wheat is mainly planted in the field, it is prone to unrepresentative indoor identification results

Method used

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  • Wheat growth period field aphid resistance screening and identifying device
  • Wheat growth period field aphid resistance screening and identifying device
  • Wheat growth period field aphid resistance screening and identifying device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0026] Implementation example 1: apply this method to the insect resistance of 30 germplasm resources of wheat to carry out preliminary evaluation, promptly had satisfactory result in less than a month, screen out many parts to the material with stronger aphid resistance, such as Shaanxi 253, Shannuo 1, Yumai 70, Amigo, etc., provided good parental materials for wheat aphid resistance breeding. The identification results are shown in the table below

[0027]

Embodiment 2

[0028] Implementation example two: apply this method to the hybrid progeny of wheat variety Amigo and wheat variety XN1376 to carry out insect resistance identification, the identification results are shown in the following table, and the progeny lines with high resistance were identified in the early generation, which greatly shortened the breeding cycle.

[0029] material name Aphid index resistance level Resistance evaluation Amigo 0.4047±0.167 2 MR XN1376 1.3504±0.056 5 MS Amigo / XN1376F2 0.5105±0.048 2 MR Amigo / XN1376F2 1.4024±0.75 5 MS

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Abstract

The invention discloses a wheat growth period field aphid resistance screening and identifying device. The device comprises a structural frame, an isolation hood and a zipper, wherein the isolation hood is arranged outside the structural frame, supported by the structural frame to form a relatively isolated wheat growth space, ventilated and pervious to light, and the zipper is arranged at the side portion of the isolation hood and used for controlling the isolation hood to be sealed and opened. The radius of the upper end and the radius of the lower end of the isolation hood are the same, thewhole isolation hood is cylindrical, the structural frame comprises a plurality of supporting rods with the same length, the device is placed in a field for conventional management, wheat and aphidsare tested in a relative space, and the number of wheat plants and the number and variety of wheat aphids can be considered to be operated as needed. The wheat aphids are fed specially and cannot be affected by external factors, results such as the aphid quantity ratio obtained through statistics are accurate, real, stable and reliable, and the wheat aphid resistance level can be truly reflected.

Description

technical field [0001] The invention belongs to the field of auxiliary equipment for wheat breeding in agricultural production, and in particular relates to a field aphid resistance screening and identification device during the wheat growth period. Background technique [0002] As one of the indispensable crops in today's world, wheat plays an important role in food production and agricultural economy. High-yield, high-quality, stress-resistant, green, and economical are the goals of wheat breeding. However, in the wheat production process, serious losses are caused due to the damage of aphids to wheat yield and quality. On average, the total yield loss can reach 15%-30%, and can reach 60% when serious. In Henan Province, the overall resistance of wheat varieties to aphids is poor, and the damage of wheat production by aphids increases year by year. [0003] Wheat aphids, as parthenogenetic pests, have a short reproductive cycle and strong reproductive ability. They can r...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): A01G22/20A01K67/033
CPCA01G22/20A01K67/033
Inventor 王春平韩志鹏郭程张伟闫雪芳
Owner HENAN UNIV OF SCI & TECH
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