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Fault detection platform of FC node machine with standard serial host interface

A host interface and detection platform technology, applied in the detection of faulty computer hardware, error detection/correction, instruments, etc., can solve problems such as low scalability and versatility, complex fault detection environment construction, etc., to achieve universality Good, easy to operate, good scalability

Pending Publication Date: 2021-02-02
XIAN AVIATION COMPUTING TECH RES INST OF AVIATION IND CORP OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The embodiment of the present invention provides a fault detection platform for FC node machines with a standard serial host interface, so as to solve the problem of complex construction of fault detection environments for FC node machines with standard serial host interfaces, low scalability and low versatility, etc. question

Method used

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  • Fault detection platform of FC node machine with standard serial host interface
  • Fault detection platform of FC node machine with standard serial host interface

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Embodiment Construction

[0049] In order to make the purpose, technical solution and advantages of the present invention more clear, the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined arbitrarily with each other.

[0050] The embodiment of the present invention aims at the problem that the fault detection environment of the FC node machine with a standard serial host interface is complicated to build, and the scalability and versatility are not high, and innovatively proposes a FC node machine with a standard serial host interface The miniaturized fault detection platform specifically relates to a fault detection platform and a design method for a standard PCIe / SRIO host interface FC node machine in a test system. This miniaturized fault detection platform supports various types of FC e...

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Abstract

The invention discloses a fault detection platform of an FC node machine with a standard serial host interface, and the platform comprises a detection platform motherboard and a detection platform structural member; the detection platform motherboard is arranged above the detection platform structural member, the detection platform motherboard is fixed by the detection platform structural member,and the detection platform motherboard is cooled; the detection platform motherboard comprises an external interface unit, a standard host interface unit, an FC interface unit, an FPGA with a built-inprocessor, and a processor circuit. The fault detection platform is used for testing various FC electrical interface node machines and optical interface node machines supporting PCIe host interfacesor SRIO host interfaces in two test modes, and the two test modes include an FC node machine opposite transmission test mode and an FC node machine surrounding test mode. The problems that an FC nodemachine of an existing standard serial host interface is complex in fault detection environment building, low in expandability and universality and the like are solved.

Description

Technical field: [0001] The invention relates to but not limited to computer hardware technology, especially a fault detection platform of FC node machine with standard serial host interface. Background technique: [0002] With the rapid development of airborne FC networks, a large number of FC node machine products with standard serial host interfaces have been developed and used. The host interfaces adopt standard PCIe or SRIO interfaces, and provide FC optical interfaces or FC electrical interfaces. The host realizes the communication management, device management, time management and network management functions of the FC node machine through the standard serial interface. As the number of FC node machines delivered and used continues to increase, the number of faulty parts in the process of product production and debugging and returned to the factory also increases. In the process of troubleshooting, it is necessary to build a relevant test environment according to dif...

Claims

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Application Information

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IPC IPC(8): G06F11/22G06F11/267G06F13/40
CPCG06F11/221G06F11/267G06F13/4022G06F2213/0026
Inventor 朱志强孙东旭武健武坚徐玉杰
Owner XIAN AVIATION COMPUTING TECH RES INST OF AVIATION IND CORP OF CHINA
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