A Generalized Hardman Sensor
A Hardman sensor technology, applied in the field of micro-nano optics and optical detection, can solve problems such as inability to detect the polarization state of incident light
Active Publication Date: 2022-01-04
HUNAN UNIV +2
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Problems solved by technology
Traditional Hardman sensors based on cmos and microlens arrays can only detect the wavefront phase, but cannot detect the polarization state of incident light, and the detection of the polarization state of light is very useful for polarization imaging and vector light field detection. Significance
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[0023] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.
[0024] In order to facilitate the understanding of the present application, the present application will be described in more detail below in conjunction with the accompanying drawings and specific embodiments. Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the technical field of this application. The terms used in the description of the present application are only for the purpose of ...
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Abstract
Embodiments of the present invention relate to the field of micro-nano optics and optical detection, and in particular to a generalized Hardman sensor. An embodiment of the present invention provides a generalized Hardman sensor, including a first metasurface element and a second metasurface element, each of the first metasurface element and the second metasurface element includes: a dielectric substrate and at least one A periodic array of dielectric nanostructures, the array of dielectric nanostructures is arranged on a dielectric substrate, the array of dielectric nanostructures includes at least one dielectric nanocolumn, the first metasurface element is used to focus incident light to the second metasurface element, the second metasurface element The second metasurface element is used to display the image with polarization state information of the incident light. When the incident light passes through the generalized Hardman sensor, the wavefront phase of the incident light can be detected by spot shifting, and the wavefront phase of the incident light can be detected by the pattern of the outgoing light. The polarization state information of the incident light.
Description
technical field [0001] Embodiments of the present invention relate to the field of micro-nano optics and optical detection, and in particular to a generalized Hardman sensor. Background technique [0002] Metasurface optical elements allow people to arbitrarily adjust the phase, amplitude, and polarization of light on a two-dimensional plane, thereby forming optical elements with various functions, and optical sensors are one of their applications. The Hardman sensor is one of the typical applications of optical sensors and is widely used in adaptive optics systems to correct wavefront aberrations. Traditional Hardman sensors based on cmos and microlens arrays can only detect the wavefront phase, but cannot detect the polarization state of incident light, and the detection of the polarization state of light is very useful for polarization imaging and vector light field detection. Significance. Contents of the invention [0003] In view of the above-mentioned defects in t...
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IPC IPC(8): G01J4/00B81C1/00B81B7/04
CPCG01J4/00B81B7/04B81C1/00031B81B2201/02B81B2203/0361G01J4/04
Inventor 胡跃强张建段辉高李苓罗栩豪宋强马国斌徐晓波
Owner HUNAN UNIV