Elliptical object feature extraction method based on maximum entropy criterion
A feature extraction and maximum entropy technology, which is applied to instruments, character and pattern recognition, computer components, etc., can solve problems such as failure and insufficient robustness of outliers, and achieve good performance
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[0043] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0044] A feature extraction method for an ellipse object based on the maximum entropy criterion proposed by the present invention, its overall realization block diagram is as follows figure 1 As shown, it includes the following steps:
[0045] Step 1: Take a photo of the elliptical object to obtain a picture; then use the existing morphological operation to preprocess the picture to obtain the preprocessed picture; then use the existing edge detection technology to detect all the images containing For edge data points including outliers, set the number of detected edge data points including outliers to N; among them, N is a positive integer, N≥5, and the larger N is, the higher the computational complexity .
[0046] Here, the noise of the picture can be removed through morphological operations, and the edge effect of the picture can be enha...
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