Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Method for Detection of Surface Defect Profile of Satellite Telescope Lens

A contour detection and telescope technology, which is used in measuring devices, optical testing flaws/defects, image enhancement, etc., which can solve the size limitation of detection optical components, inability to detect large-sized optical components in-situ non-contact defect detection, and complex equipment assembly, etc. question

Active Publication Date: 2022-04-19
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For the traditional precision system for detecting surface defects, although the detection accuracy is high, the equipment assembly is complicated and the cost is high, and there are strict requirements on the positional relationship and movement of the components. If the specific posture changes, the The directional indication also changes accordingly, so the operator is required to have a certain knowledge base of the optical neighborhood
The biggest disadvantage of the precision system is that the size of the detection optical components is limited. The measured objects are usually in the order of centimeters or decimeters, and it is impossible to perform in-situ non-contact defect detection on large-size optical components.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Method for Detection of Surface Defect Profile of Satellite Telescope Lens
  • A Method for Detection of Surface Defect Profile of Satellite Telescope Lens
  • A Method for Detection of Surface Defect Profile of Satellite Telescope Lens

Examples

Experimental program
Comparison scheme
Effect test

example

[0127] In the present embodiment, there is a scratch defect on the surface of the lens of the satellite telescope, Figure 7 There is a scratch at the upper middle edge, and particles formed by gas curing attach to the lens, in an irregular and scattered distribution. use Figure 1 The detection system shown collects the image of defects on the surface of the satellite telescope lens, opens the vertical calibrator, and illuminates the laser spot in the geometric center of the measured lens placed horizontally, ensuring that the vertical calibrator is perpendicular to the lens of the satellite under test. Adjust the position of the sliding assembly on the ruler slide and move the direct light source to the position of the vertical calibrator so that the center of the direct light source is on the same axis as the center of the lens of the satellite under test. Adjust the height of the ruler slide so that the measured lens can be fully illuminated by the direct light source, and the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a detection method for surface defect contour of a satellite telescope lens. The optimized clustering algorithm is used to classify the collected optical defect images to suppress the influence of the inhomogeneity of illumination intensity on the intensity of the collected images. Regularization term, which not only considers the neighborhood information, but also considers the neighborhood information of the neighborhood to ensure the detection accuracy of the defect. After the classified image, the edge detection algorithm is used to extract the rough outline of the defect, and then polynomial fitting is selected to further refine the outline, improve the fitting accuracy, and better characterize the outline feature information, so that the satellite telescope lens can be used later. Quantitative analysis of defects.

Description

[0001] Technical neighborhood [0002] The present invention belongs to the surface defect detection technology neighborhood, more specifically, relates to a satellite telescope lens surface defect profile detection method. Background [0003] Ultra-precision optics are an important part of many high-end instruments and equipment systems. In aerospace neighborhoods, a large number of optical components are used in satellites, most notably satellite telescopes, and are usually in the order of meters in diameter. For satellites, their main function is to shoot, reconnoiter and monitor the ground, so the space telescope used for satellites requires high imaging sensitivity, high precision and strong resolution. Satellite telescopes in the atmospheric environment, gas does not affect the shooting process. But in space, due to its low temperature, the gases in the nebula (such as hydrogen, methane) will solidify into particulate matter and attach to the lens, forming a surface defect. T...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G06T7/13G06V10/764G06V10/762G06K9/62G06T5/00G01N21/88
CPCG06T7/0002G06T7/13G06T5/002G01N21/8851G06T2207/10004G01N2021/8887G06F18/2321G06F18/241
Inventor 程玉华陈薇殷春王胤泽张博陈凯杨晓邱根
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products