Photovoltaic module testing device and testing method

Abstract

The invention discloses a photovoltaic module testing device and testing method. The testing device comprises a testing box body and a control device, the testing box body is used for testing the temperature and the humidity of a photovoltaic module, the control device is used for adjusting the temperature and the humidity of the testing box body, and a light source assembly, a placement assemblyand a detection assembly are further arranged in the testing box body; and a corresponding light source assembly is arranged in the testing box body, a light source can be provided for irradiating thephotovoltaic assembly in the test process, and illumination factors are increased, so that the test accuracy is improved. During testing, the bottom of the photovoltaic module is inserted into a slotin a sliding manner, and during dismounting, the photovoltaic module is directly pulled out, so that the whole photovoltaic module can be mounted and dismounted conveniently and quickly, the consumedtime is shorter, the testing efficiency is higher, the testing method of the testing device is used, and an outdoor environment can be simulated more accurately by introducing an illumination condition. The PID recovery phenomenon caused by illumination is eliminated, and the outdoor PID phenomenon of the photovoltaic module can be tested more truly.

Description

technical field [0001] The invention relates to the field of photovoltaic module production, in particular to a photovoltaic module testing device and a testing method thereof. Background technique [0002] Potential decay (PID) is a common phenomenon in crystalline silicon cells. The PID decay mechanism of PERC double-sided cells is generally recognized as PID-s and PID-p. PID-s occurs on the front side, PID-p occurs on the back side, and PID- The p-polarization effect can be restored under light conditions. [0003] Potential decay (PID) is a common phenomenon in crystalline silicon cells. The PID decay mechanism of PERC double-sided cells is generally recognized as PID-s and PID-p. PID-s occurs on the front side, PID-p occurs on the back side, and PID- The p-polarization effect can be restored under light conditions. [0004] PID-s mechanism: Positively charged sodium ions drift and enter the cell through the SiNy and SiO2 layers, causing stacking and PN junction shunti...

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Problems solved by technology

[0008] At present, the PID test method is to test in an indoor test box or under normal temperature conditions. The test box condition is an accelerated test method that simulates a certain temperature and humidity conditions and applies positive and negative bias voltages. It is all carried out under no light conditions; and because There is no light factor in the test method, and it is impossible to accurately test the battery components that are susceptible to light recovery, so it is impossible to accurately evaluate the outdoor PID attenuation of photovoltaic modules; The bracket is installed on the module, and the bracket is removed after the test is completed to take out the photovoltaic module. The overall installation and disassembly is inconvenient, and it takes a lot of time, and the test efficiency is relatively low.

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