Dynamic migration method of cluster measurement and control device
A technology of measurement and control devices and dynamic migration, which is applied in the direction of circuit devices, digital transmission systems, electrical components, etc., can solve problems such as insufficient and unified on-site acceptance, lagging technical specifications, and defects in the standardization level of automation equipment, so as to avoid function loss, The effect of ensuring validity and continuity and ensuring reliability
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[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in combination with specific embodiments and with reference to the accompanying drawings. It should be understood that these descriptions are exemplary only, and are not intended to limit the scope of the present invention. Also, in the following description, descriptions of well-known structures and techniques are omitted to avoid unnecessarily obscuring the concept of the present invention.
[0024] The dynamic migration of the measurement and control device is to realize that the cluster measurement and control device has the same two sets of measurement and control functions running on the same interval at any time. On another set of spare cluster measurement and control devices. figure 1 A schematic diagram of the dynamic migration of the measurement and control device is shown. From figure 1 It can be s...
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