A configuration method and related equipment for controlling the scan cycle of a control system
A scanning cycle and control system technology, applied in the configuration field of the scanning cycle of the control system, can solve the problems of changing processing time, cumbersome process, low efficiency, etc., and achieve the effect of improving efficiency
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[0049] Embodiments of the present application are described below in conjunction with the accompanying drawings. Apparently, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Those of ordinary skill in the art know that, with the development of technology and the emergence of new scenarios, the technical solutions provided in the embodiments of the present application are also applicable to similar technical problems.
[0050] The terms "first", "second" and the like in the specification and claims of the present application and the above drawings are used to distinguish similar objects, and are not necessarily used to describe a specific sequence or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, and this is just a way to distinguish objects of the same attribute described in the embodiments of the present application. Furthermore, the terms "...
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