Tantalum capacitor measuring device

A measuring device and technology of tantalum capacitors, applied in the field of tantalum capacitor measuring devices, can solve the problems of slow measurement work efficiency of tantalum capacitors, etc., and achieve the effect of improving measurement work efficiency

Pending Publication Date: 2021-04-09
佛山明凯泰克机械有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, the tantalum capacitance measurement devices disclosed above are all separately tested for a single performance of the tantalum capacitance, and the measurement efficiency of the tantalum capacitance is slow, and its work efficiency needs to be improved urgently

Method used

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Embodiment Construction

[0032] The technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Apparently, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0033] The present invention will be described in further detail below through specific implementation examples and in conjunction with the accompanying drawings.

[0034] Such as figure 1 Shown, a kind of tantalum capacitance measuring device, it comprises:

[0035] A track 1 and a tooling plate 2 suitable for moving along the track 1 under the driving action of a motion mechanism, and a plurality of tantalum capacitors are installed and arranged in the tooling plate 2;

[0036] A measuring mechanism 3, whi...

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Abstract

The invention provides a tantalum capacitor measuring device, which comprises a track and a tooling plate suitable for moving along the track under the driving action of a moving mechanism, and a plurality of tantalum capacitors are arranged in the tooling plate. The device further comprises a measuring mechanism, the measuring mechanism at least comprises a surge test station, an electric leakage test station and a three-parameter test station which synchronously move, and the test stations are correspondingly arranged along the movement path of the tooling plate. The tooling plate is driven by the moving mechanism to move to the measuring mechanism along the track, the probes at the test stations are respectively in contact with the tantalum capacitors, and surge, electric leakage and three-parameter tests are respectively carried out at the surge test station, the electric leakage test station and the three-parameter test station. According to the technical scheme, a plurality of performances of the tantalum capacitors can be respectively tested at the same time, and the measurement work efficiency is high.

Description

technical field [0001] The invention relates to a tantalum capacitance measuring device. Background technique [0002] As we all know, in order to ensure the quality and reliability of chip tantalum capacitor products, performance testing is required during the production process. Such as: [0003] CN201320638670.7 discloses a chip tantalum capacitor measuring tool, including a measuring instrument with a power supply, a discharge resistor and a fixture; the double control switch is fixed on the base, and the measuring instrument and the discharge resistor are respectively connected to the two outputs of the dual control switch end, the measuring instrument and the other end of the discharge resistor are connected in parallel and electrically connected to the input end of the double control switch through the fixture; above the double control switch is a pedal hinged on the base, and the back of the pedal has a spring fixed on the base. It completely avoids the phenomenon ...

Claims

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Application Information

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IPC IPC(8): G01R31/64
CPCG01R31/64
Inventor 周凯咨胡传喜文师应关聪
Owner 佛山明凯泰克机械有限公司
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