42 results about "Current Leakage Testing" patented technology

A method of detecting faults in a traction motor installation having a plurality of AC traction motors powered from a common power source, each of the traction motors being connected by associated motor cables to a cable junction and the common power source being connected to the cable junction by main cables, includes disconnecting the power source from the main cables and performing initial short circuit to ground, short circuit between phases and leakage to ground tests on the traction motors through the main cables. When a fault is detected by the initial tests, at least one detailed test is performed by applying a predetermined voltage to the main cables and sensing current flow in the motor cables connected to each of the motors. The detailed test is one of a detail short circuit to ground test, a detail short circuit phase to phase test, and a detail leakage to ground test.

The invention discloses an insulativity detection device for cable maintenance, relates to the technical field of insulativity detection, and solves the problems that the operation is too tired when an erected cable is detected at present, and the wire take-up and pay-off are very inconvenient when the wire take-up and pay-off are detected. The insulativity detection device comprises a vehicle body; a supporting plate is fixedly arranged at the top of the vehicle body; four first supporting rods are installed among the four sets of side supporting plates at the top in a sliding mode. Five second supporting rods are fixedly connected to the right sides between the five sets of side supporting plates in a welded mode. The outer sides of the four first supporting rods and the outer sides of the five second supporting rods are each rotationally provided with two rotating wheels. An electric leakage tester is further fixedly mounted on the right side of the top of the supporting plate. Thedevice is supported by the shear fork mechanism during detection, a detector does not need to hold the device by hand all the time, the fatigue degree of workers is greatly reduced, more labor is saved during detection, manual operation is not needed during winding of a wire, the wire can be automatically pulled into the vehicle body, and the winding convenience is greatly improved.

The invention relates to a judgment method of composite insulator aging degree. The judgment method comprises the following steps: S1, performing hydrophobic performance testing, current leakage testing and tension testing on a to-be-tested composite insulator; S2, determining a comprehensive aging factor of the to-be-tested composite insulator according to a hydrophobic performance testing result, a current leakage testing result and a tension testing result of the to-be-tested composite insulator; and S3, determining the aging degree of the to-be-tested composite insulator according to the comprehensive aging factor. The judgment method has the following advantages: 1) the hydrophobic performance testing, the current leakage testing and the tension testing are combined to commonly detectthe aging degree of the composite insulator, and the aging state of the composite insulator can be well reflected in compared with the hydrophobic performance testing, the current leakage testing andthe tension testing, and the accuracy is high; and 2) compared with the judgment method of a scanning electron microscope and the infrared spectroscopy, the judgment method disclosed by the inventionis simpler and more convenient, and the cost is low.

A circuit breaker comprises a shell, and a circuit breaker phase electrode and an electric leakage protection electrode which are arranged on two sides of the shell side by side. The circuit breaker is characterized in that the electric leakage protection electrode comprises a zero sequence current transformer, an electric leakage operation mechanism, an electric leakage test mechanism, a neutralpole static contact and a neutral pole moving contact which are oppositely arranged in the shell; the circuit breaker phase pole comprises a phase pole operating mechanism, a static contact and a moving contact which are oppositely arranged, wherein the moving contact is connected with the phase pole operating mechanism; the main loop of the phase pole of the circuit breaker passes through the zero sequence current transformer; the test mechanism forms a test loop with double breakpoints through two contacts of a first contact part and a second contact part on the elastic part; moreover, the first contact part is driven by the neutral line driving part connected with the neutral pole moving contact to be contacted with the first contact part, and the neutral line driving part is connectedwith the phase pole operating mechanism or the electric leakage operating mechanism, so the test button can be pressed down to disconnect the test loop when the phase pole of the circuit breaker is switched off, and the reliability of the circuit breaker is improved.

The invention relates to the technical field of electric leakage testing, and particularly discloses a leakage current testing device which comprises a box body, an electric leakage tester and a box cover, wherein the box body is hollow, and the electric leakage tester is installed in the box body; a socket and a wiring terminal are arranged on the outer side of the box body, the socket and the wiring terminal are electrically connected with the electric leakage tester, and a display panel and an adjusting knob are arranged on the electric leakage tester; the box cover is matched with an innergroove of the box body, a positioning hole is formed in the side face of the box cover, a fixing hole is correspondingly formed in the box body, and the fixing hole and the positioning hole are connected through a pin. Heat dissipation holes are formed in the side surface of the box body; a handle is arranged above the box cover; the leakage current testing device provided by the invention can perform electric leakage detection on the equipment, the equipment is directly connected with the wiring terminal, and a power supply is connected through the socket; in the using process, operation isconvenient, safety and reliability are achieved, performance is good, and maintenance is convenient.

The invention belongs to the technical field of circuit physical parameter detection. The invention discloses a control system based on circuit physical parameter detection. The control system based on circuit physical parameter detection comprises: a current detection module, a voltage detection module, a resistance detection module, a central control module, a power calculation module, an electric leakage test module, a circuit fault diagnosis module, an alarm module and a display module. According to the invention, the electric leakage test module is used for measuring the current of a second signal pin in signal pins of a to-be-tested element and judging whether the to-be-tested element has leakage current or not according to the current, so that the test accuracy is high; meanwhile, the circuit fault diagnosis module utilizes a projection mode to project defect points on a circuit board, so that maintenance personnel can conveniently position and maintain defects of the circuit board, the system is suitable for products of various sizes and models, and the technical problem that in the prior art, the circuit fault detection result display effect is not visual, and consequentlythe maintenance process of the maintenance personnel is complex is solved.

The invention provides an electric leakage test structure and an electric leakage test method. the electric leakage test structure comprises a substrate, and a first well region and a second well region are formed in the substrate; and the electric leakage test structure further comprises a first shallow trench isolation structure formed between the second well region and the first well region, a first source and drain region formed in the first well region, a plurality of second source and drain regions formed in the second well region and a test grid electrode formed on the substrate. In the electric leakage test method, the design sizes of the plurality of electric leakage test structures are different, and each electric leakage test structure is tested, so that the leakage current in each electric leakage test structure can be obtained; and the corresponding relation between the design size and the leakage current in the electric leakage test structure is obtained according to the leakage current in each electric leakage test structure, so that the problems of parasitic electric leakage and the like caused by the internal design of the semiconductor device can be reflected.

The invention relates to the field of power equipment, in particular to an intelligent earth leakage protection switch. The switch comprises an earth leakage protection switch body, an instruction receiving module, a test triggering module and a judgment indication module. The instruction receiving module receives a test instruction periodically sent by the superior controller, and controls the test trigger module to trigger an electric leakage test function after receiving the test instruction; and when the judgment indication module does not detect the leakage protection action, the alarm prompt information is sent. In the invention, the control equipment at the upper level can send out or generate a signal which can be identified by the electric leakage protection switch and can be uniquely identified, and when the electric leakage protection switch identifies the signal, the electric leakage protection test function is executed, so the normal function of the electric leakage protection switch can be ensured. According to the invention, the leakage protection function of the leakage protection switch can be periodically and automatically tested.

A leakage testing method for a DRAM having a recess gate is provided. The method includes the steps of: programming to set the first storage unit and the second storage unit of a same memory cell with different storage statuses; and disturbing one of the word lines extending through the memory cells; then determining whether the DRAM is acceptable or not. When another one of the word lines extending through the memory cells is caused with a reading error by disturbing the one of the word lines extending through the memory cells, a failure is determined as occurred, and the failure is attributed to a leakage type of extended depletion region. When the another one of the word lines extending through the memory cells is not caused with a reading error by disturbing the one of the word lines extending through the memory cells, the DRAM is determined as acceptable.

The invention discloses an electric leakage test method of a Nand type flash memory. The Nand type flash memory comprises a storage unit and a sense amplifier, the first end of a high-voltage tube ofthe sense amplifier is electrically connected with the first end of a pre-charging capacitor, the second end of the high-voltage tube and the first end of the storage unit are electrically connected with a bit line, the second end of the pre-charging capacitor is grounded, and the second end of the storage unit is electrically connected with a source line. The electric leakage test method of the Nand type flash memory comprises the following steps: in an erasure verification stage of the Nand type flash memory, comparing a stable voltage of a first end of a high-voltage tube with a reference voltage; and judging whether the high-voltage tube leaks electricity according to the comparison result. According to the invention, the electric leakage test of the high-voltage tube is carried out through the multiplexing erasure verification process, so that the voltage difference loaded at the two ends of the high-voltage tube is relatively large, the electric leakage condition of the high-voltage tube in the sense amplifier can be effectively detected, and the reliability of the Nand type flash memory is improved.

The invention relates to a manufacturing process of an ultra-miniature semiconductor cooler, which comprises the following steps: crystal grain preparation: cutting a crystal bar into a wafer, electroplating the wafer, cutting the electroplated wafer, cleaning the crystal grain, and coating the crystal grain with a UV (ultraviolet) film to obtain standby crystal grains; printing the hot-side ceramic plate, fixing the standby crystal grains on the hot-side ceramic plate, printing the cold-side ceramic plate, carrying out die assembly welding on the hot-side ceramic plate with the fixed crystal grains and the printed cold-side ceramic plate, and carrying out resistance and infrared testing, grinding, wire welding, glue sealing, electric leakage testing and code spraying to obtain the ultra-miniature semiconductor cooler. According to the process, a multi-wire cutting machine is adopted for cutting the wafer, the ultrasonic cleaning time is shortened, the problems of cavities and product deformation are reduced through a die assembly welding method, and the ultra-miniature semiconductor cooler prepared through the method has good cold and hot impact resistance, is not prone to deformation in the wafer electroplating process and is uniform in product heat dissipation.