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42 results about "Current Leakage Testing" patented technology

Leakage Current Tester. Hipot is an abbreviation for high potential. Traditionally, Hipot is a term given to a class of electrical safety testing instruments used to verify electrical insulation in finished appliances, cables or other wired assemblies, printed circuit boards, electric motors, and transformers.

Insulativity detection device for cable maintenance

The invention discloses an insulativity detection device for cable maintenance, relates to the technical field of insulativity detection, and solves the problems that the operation is too tired when an erected cable is detected at present, and the wire take-up and pay-off are very inconvenient when the wire take-up and pay-off are detected. The insulativity detection device comprises a vehicle body; a supporting plate is fixedly arranged at the top of the vehicle body; four first supporting rods are installed among the four sets of side supporting plates at the top in a sliding mode. Five second supporting rods are fixedly connected to the right sides between the five sets of side supporting plates in a welded mode. The outer sides of the four first supporting rods and the outer sides of the five second supporting rods are each rotationally provided with two rotating wheels. An electric leakage tester is further fixedly mounted on the right side of the top of the supporting plate. Thedevice is supported by the shear fork mechanism during detection, a detector does not need to hold the device by hand all the time, the fatigue degree of workers is greatly reduced, more labor is saved during detection, manual operation is not needed during winding of a wire, the wire can be automatically pulled into the vehicle body, and the winding convenience is greatly improved.
Owner:胡丹萍

Circuit breaker

A circuit breaker comprises a shell, and a circuit breaker phase electrode and an electric leakage protection electrode which are arranged on two sides of the shell side by side. The circuit breaker is characterized in that the electric leakage protection electrode comprises a zero sequence current transformer, an electric leakage operation mechanism, an electric leakage test mechanism, a neutralpole static contact and a neutral pole moving contact which are oppositely arranged in the shell; the circuit breaker phase pole comprises a phase pole operating mechanism, a static contact and a moving contact which are oppositely arranged, wherein the moving contact is connected with the phase pole operating mechanism; the main loop of the phase pole of the circuit breaker passes through the zero sequence current transformer; the test mechanism forms a test loop with double breakpoints through two contacts of a first contact part and a second contact part on the elastic part; moreover, the first contact part is driven by the neutral line driving part connected with the neutral pole moving contact to be contacted with the first contact part, and the neutral line driving part is connectedwith the phase pole operating mechanism or the electric leakage operating mechanism, so the test button can be pressed down to disconnect the test loop when the phase pole of the circuit breaker is switched off, and the reliability of the circuit breaker is improved.
Owner:ZHEJIANG CHINT ELECTRIC CO LTD

Leakage current testing device

The invention relates to the technical field of electric leakage testing, and particularly discloses a leakage current testing device which comprises a box body, an electric leakage tester and a box cover, wherein the box body is hollow, and the electric leakage tester is installed in the box body; a socket and a wiring terminal are arranged on the outer side of the box body, the socket and the wiring terminal are electrically connected with the electric leakage tester, and a display panel and an adjusting knob are arranged on the electric leakage tester; the box cover is matched with an innergroove of the box body, a positioning hole is formed in the side face of the box cover, a fixing hole is correspondingly formed in the box body, and the fixing hole and the positioning hole are connected through a pin. Heat dissipation holes are formed in the side surface of the box body; a handle is arranged above the box cover; the leakage current testing device provided by the invention can perform electric leakage detection on the equipment, the equipment is directly connected with the wiring terminal, and a power supply is connected through the socket; in the using process, operation isconvenient, safety and reliability are achieved, performance is good, and maintenance is convenient.
Owner:SHANGHAI INST OF MEASUREMENT & TESTING TECH

Silicon carbide power semiconductor device testing method

The invention provides a silicon carbide power semiconductor device testing method. The method comprises the following steps: acquiring grid screening reference voltage; testing to obtain a first rated threshold voltage of each silicon carbide power semiconductor device to be tested; the to-be-tested device grid voltage of each to-be-tested silicon carbide power semiconductor device is tested; when the grid voltage of the to-be-tested device is greater than or equal to the grid screening reference voltage, judging preliminary qualification; testing to obtain a preliminarily qualified second rated threshold voltage of each silicon carbide power semiconductor device to be tested; and when the difference amplitude between the first rated threshold voltage and the second rated threshold voltage is greater than a preset change rate threshold, determining that the silicon carbide power semiconductor device is unqualified, otherwise, determining that the silicon carbide power semiconductor device to be detected is qualified. According to the technical scheme, screening is carried out through the grid leakage current test, the threshold voltage test, the grid voltage comparison and the threshold voltage comparison, damaged chips in the grid leakage current test can be effectively screened out, the screening efficiency is ensured, and the screening precision is improved.
Owner:ZHUZHOU CRRC TIMES SEMICON CO LTD

Control system based on circuit physical parameter detection

The invention belongs to the technical field of circuit physical parameter detection. The invention discloses a control system based on circuit physical parameter detection. The control system based on circuit physical parameter detection comprises: a current detection module, a voltage detection module, a resistance detection module, a central control module, a power calculation module, an electric leakage test module, a circuit fault diagnosis module, an alarm module and a display module. According to the invention, the electric leakage test module is used for measuring the current of a second signal pin in signal pins of a to-be-tested element and judging whether the to-be-tested element has leakage current or not according to the current, so that the test accuracy is high; meanwhile, the circuit fault diagnosis module utilizes a projection mode to project defect points on a circuit board, so that maintenance personnel can conveniently position and maintain defects of the circuit board, the system is suitable for products of various sizes and models, and the technical problem that in the prior art, the circuit fault detection result display effect is not visual, and consequentlythe maintenance process of the maintenance personnel is complex is solved.
Owner:SHANDONG BUSINESS INST

Automatic testing and winding all-in-one machine

The invention discloses an automatic testing and winding all-in-one machine. The machine comprises a controller and a machine table, wherein the machine table is provided with a double-station testing mechanism, a wire conveying mechanism and a winding mechanism which are connected with the controller, the double-station testing mechanism is used for conducting a conduction test and an electric leakage test on wires, and the winding mechanism is used for arranging and packaging wires which are tested to be qualified; the wire conveying mechanism is used for conveying the wire from the double-station testing mechanism to the wire winding mechanism; the wire conveying mechanism comprises a wire pulling and conveying mechanism, a wire arranging mechanism and a wire taking hand mechanism, the wire pulling and conveying mechanism is used for conveying qualified wires on the double-station testing mechanism to the wire arranging mechanism, and the wire arranging mechanism is used for arranging the wires conveyed by the wire pulling and conveying mechanism in order; the wire taking hand mechanism is used for conveying the wires which are arranged in order on the wire arranging mechanism to the wire winding mechanism. According to the device, integrated operation of wire testing and winding storage is achieved, one device achieves two functions, the automation level of the device is improved, and a large amount of labor cost is saved.
Owner:SHENZHEN LIANCHENGZHI TECH CO LTD

Anti-creeping testing device for numerical control machine tool research and development

The invention relates to the field of numerical control machine tool research and development, in particular to an anti-creeping testing device for numerical control machine tool research and development. A water tank is arranged at the right end of a second electric telescopic mechanism, a third electric telescopic mechanism is arranged at the lower end of the water tank, and a driving mechanismis arranged at the lower end of the third electric telescopic mechanism. The driving mechanism comprises a first mounting base, a mounting groove is formed in the first mounting base, a second motor is arranged on the outer side of the first mounting base, a second mounting base is connected to the interior of the mounting groove through a first rotating shaft, the output end of the second motor is connected with the first rotating shaft, and a third motor is arranged in the second mounting base; and a second rotating shaft is arranged at the output end of the third motor, a rotating seat is arranged at the outer end of the second rotating shaft, and an electric leakage test main body is arranged in the right side of the rotating seat. The structure can achieve the omnibearing anti-electric leakage test of the machine tool, the comprehensiveness and accuracy of the test are improved, and the practicability is high.
Owner:CHINA NORTH STANDARDIZATION CENT

A leakage test system and test method for defective optical device capacitor elements based on the device side

The invention provides a leakage test system for defective optical device capacitive elements based on the device end, including: a voltmeter (3), an ammeter (7), a variable resistance set and an optical receiving device, wherein both the ammeter and the voltmeter are grounded, and the ammeter The other end is connected to the variable resistance set, and the other end of the variable resistance set is connected to the optical receiving device. The optical receiving device includes a VCC capacitor (2), a transimpedance amplifier (1), an RSSI capacitor (10) and a detector ( 4), one end of the RSSI capacitor is connected to the variable resistance set, one end of the VCC capacitor is grounded, the other end is respectively connected to the transimpedance amplifier and the voltmeter, and one end of the detector is connected to the transimpedance amplifier; the variable resistance set is a series or parallel connection formed by resistors In the circuit, the resistance of the variable resistor set can be adjusted. Different products have different requirements for matching resistors. By adjusting the voltage value and current value, it is judged whether there is a capacitor failure in the receiving optical device. Corresponding testing methods are also disclosed.
Owner:GUILIN OPTOSEAL TECH CO LTD

A low leakage connector

The embodiment of the invention provides a low-electric leakage connector. The low-electric leakage connector comprises multiple telescopic connection mechanisms; one end of each telescopic connectionmechanism is correspondingly connected with a first signal electrode of a first test substrate and a first equipotential electrode respectively, and the other end of the telescopic connection mechanism is correspondingly connected with a second signal electrode of a second test substrate and a second equipotential electrode respectively; a ground shield mechanism is arranged on the ground electrode of the first test substrate or the ground electrode of the second test substrate; and a ground connection part is connected between the ground electrode of the first test substrate and the ground electrode of the second test substrate. Thus, according to the low-electric leakage connector, pins of the first test substrate and the second test substrate can be electrically connected while the low-electric leakage performance is kept, the number of low-electric leakage connectors can be determined according to the number of to-be-connected pins, the multiple low-electric leakage connectors canfurther be used to connect and test a low-electric leakage test substrate with multiple pins, and the test efficiency is improved.
Owner:INST OF MICROELECTRONICS CHINESE ACAD OF SCI

Discharging method and device of capacity fall-off tester

ActiveCN102169129APrevent mechanical vibration and arcing phenomenon of high voltage and high currentAvoid arcingElectrical measurement instrument detailsElectrical testingCapacitanceTester device
The invention provides a discharging method of a capacity fall-off tester. In the discharging method, mechanical discharging is adopted after electronic discharging, momentary large voltage and large current are not generated at the initial discharging stage, so that the arcing phenomena of mechanical dithering, large voltage and large current are avoided. The invention also provides a device forthe method. The device comprises a discharging selection switch, an electronic discharging circuit, a mechanical discharging circuit, a voltage comparator and a tested capacitor controlled by a microprocessor, wherein two ends of the tested capacitor are connected to the electronic discharging circuit and the mechanical discharging circuit. By adopting the device, the results such as machine halt, resetting and the like caused by the disturbance of various instruments on a digital control system during capacitor discharging can be avoided.
Owner:UNI TREND TECH (CHINA) CO LTD

Direct-current charging pile testing device

The invention discloses a direct-current charging pile testing device which comprises a damping mechanism, a clamping mechanism and an electric leakage testing mechanism. The damping mechanism comprises a shell, a lifting mechanism is arranged at the front side of the shell, and a moving mechanism is arranged at the bottom side of the shell; a supporting mechanism is arranged at the rear side of the shell, a first damping rubber is arranged at the bottom side in the shell, a testing machine is placed on the first damping rubber, and a sealing cover is hinged to the upper surface of the shell;second damping rubber is arranged at the bottom side in the sealing cover and is located on the upper surface of the testing machine, and a clamping mechanism is arranged at the front side of the shell and the front side of the sealing cover; and the clamping mechanism comprises eight first fixing sleeves. The direct-current charging pile testing device can carry out electric leakage testing on adirect-current charging pile, electric shock is avoided, dangers to workers are prevented; moreover, the testing device can be conveniently carried and damped, damage to the testing device is prevented, and the direct-current charging pile testing device can be conveniently used by a user.
Owner:SUZHOU TRACEABILITY STANDARD CERTIFICATION & INSPECTION CO LTD

Electric leakage test method of Nand type flash memory

ActiveCN110838335AImprove reliabilityEfficiently detect leakage conditionsStatic storageCapacitanceBit line
The invention discloses an electric leakage test method of a Nand type flash memory. The Nand type flash memory comprises a storage unit and a sense amplifier, the first end of a high-voltage tube ofthe sense amplifier is electrically connected with the first end of a pre-charging capacitor, the second end of the high-voltage tube and the first end of the storage unit are electrically connected with a bit line, the second end of the pre-charging capacitor is grounded, and the second end of the storage unit is electrically connected with a source line. The electric leakage test method of the Nand type flash memory comprises the following steps: in an erasure verification stage of the Nand type flash memory, comparing a stable voltage of a first end of a high-voltage tube with a reference voltage; and judging whether the high-voltage tube leaks electricity according to the comparison result. According to the invention, the electric leakage test of the high-voltage tube is carried out through the multiplexing erasure verification process, so that the voltage difference loaded at the two ends of the high-voltage tube is relatively large, the electric leakage condition of the high-voltage tube in the sense amplifier can be effectively detected, and the reliability of the Nand type flash memory is improved.
Owner:GIGADEVICE SEMICON (BEIJING) INC +1

Manufacturing process of ultra-miniature semiconductor cooler

The invention relates to a manufacturing process of an ultra-miniature semiconductor cooler, which comprises the following steps: crystal grain preparation: cutting a crystal bar into a wafer, electroplating the wafer, cutting the electroplated wafer, cleaning the crystal grain, and coating the crystal grain with a UV (ultraviolet) film to obtain standby crystal grains; printing the hot-side ceramic plate, fixing the standby crystal grains on the hot-side ceramic plate, printing the cold-side ceramic plate, carrying out die assembly welding on the hot-side ceramic plate with the fixed crystal grains and the printed cold-side ceramic plate, and carrying out resistance and infrared testing, grinding, wire welding, glue sealing, electric leakage testing and code spraying to obtain the ultra-miniature semiconductor cooler. According to the process, a multi-wire cutting machine is adopted for cutting the wafer, the ultrasonic cleaning time is shortened, the problems of cavities and product deformation are reduced through a die assembly welding method, and the ultra-miniature semiconductor cooler prepared through the method has good cold and hot impact resistance, is not prone to deformation in the wafer electroplating process and is uniform in product heat dissipation.
Owner:夏丽华
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