70 results about "Current Leakage Testing" patented technology

The invention relates to an electric leakage test method for an intelligent power module, which comprises the following steps: S1, providing the intelligent power module which comprises a control chip, an inverter unit and a pin assembly, and the inverter unit comprises an upper bridge arm circuit connected with a U / V / W phase output end and the control chip and a lower bridge arm circuit connected with an NU / NV / NW phase output end and the control chip; s2, the U-phase output end is in short circuit with bootstrap voltage VBU, the V-phase output end is in short circuit with bootstrap voltage VBV, and the W-phase output end is in short circuit with bootstrap voltage VBW; s4, starting a 15V low-voltage power supply and a 5V low-voltage power supply; s5, starting a high-voltage power supply DC to apply 600V voltage to the NU / NV / NW phase output end from the U / V / W phase output end; s6, after the electric leakage values of the U-phase output end, the V-phase output end, the W-phase output end, the NU-phase output end, the NV-phase output end and the NW-phase output end are read through the monitoring equipment, electric leakage testing is completed; and S7, sequentially disconnecting the relay and the power supply. According to the method provided by the invention, the product test yield is improved, and the product reliability and the test safety are ensured.

The utility model relates to photovoltaic module test integrated equipment, which comprises a feeding mechanism and a test mechanism, the feeding mechanism is used for providing a test product, the test mechanism comprises a transportation device, an optical detection device, an insulation test device and a wet electric leakage test device, the optical detection device is used for carrying out defect detection on the appearance of the test product, and the insulation test device is used for carrying out insulation test. The insulation test device is used for detecting the insulation performance of a test product in a dry environment, the wet electric leakage test device is used for detecting the insulation performance of the test product in a wet environment, and the transportation device is used for moving the test product among the feeding mechanism, the optical detection device, the insulation test device and the wet electric leakage test device; according to the photovoltaic module test integrated equipment, through cooperation of the feeding mechanism and the test mechanism, full automation of feeding, multi-project test and discharging processes is achieved, the test efficiency is effectively improved, flaws do not need to be recognized by human eyes during testing, and the inspection effect is improved.

The utility model discloses a bolt capacitor full-automatic testing device, which relates to the technical field of bolt testing and comprises a feeding conveying part used for conveying materials, a testing mechanism, a row-changing translation mechanism, a defective product shelf and a second shelf. And the testing mechanism comprises a CCD reversing station, a discharge station, a plurality of uniformly arranged boost monitoring stations, a plurality of uniformly arranged electric leakage testing stations, a second discharge station and an ESR testing station which are arranged in sequence. Goods to be detected are conveyed to the testing mechanism through the feeding conveying part, the goods are tested in sequence through a plurality of monitoring stations on the testing mechanism, and tested partial capacity defective products, high-loss defective products, short-circuit defective products and implosion defective products are conveyed to corresponding goods grooves of the defective product shelf through the first row-changing translation clamp. Good products, electric leakage standard-exceeding products and ESR standard-exceeding products which are tested are sequentially conveyed into corresponding goods grooves of a second goods shelf through a second row-changing translation clamp, so that the device is high in working efficiency and good in using effect.

This utility model discloses a circuit breaker, belonging to the field of low-voltage electrical technology. The circuit breaker includes a contact structure and a leakage current test circuit. The contact structure includes a first moving contact and a conductive rod electrically connected to the first moving contact. The leakage current test circuit includes a test resistor and a spring contact. The test resistor has a first lead, and the first lead and the end of the conductive rod facing the spring contact are both abutted against and electrically connected to the first surface of the spring contact. The circuit breaker provided by this utility model adopts a lap-connection power extraction method to electrically connect the test resistor and the first moving contact, so as to realize the leakage current test circuit extracting power from the first end of the test resistor, effectively reducing the use of wires, that is, reducing the number of wire connection points and soldering points, reducing the risk of short circuit and leakage current test circuit failure, facilitating assembly, and effectively reducing manufacturing costs.

The embodiment of the invention discloses a semiconductor device, a manufacturing method, a power module, a power conversion circuit and a vehicle. The semiconductor device comprises an interlayer dielectric layer electric leakage test structure located in a test area, wherein the interlayer dielectric layer electric leakage test structure comprises a semiconductor body with a first surface and a second surface which are oppositely arranged; a first insulating layer; a plurality of second insulating layers arranged at intervals; a plurality of first electrode layers; the interlayer dielectric layer is provided with a first through hole and a second through hole; the test electrode layer comprises a first test electrode and a second test electrode; the first test electrode is connected with the first electrode layer through the first through hole; the second test electrode is connected with the first insulating layer through the second through hole; and the third through hole is used for isolating the first test electrode from the second test electrode. The interlayer dielectric layer electric leakage test structure is arranged, voltage control is provided through the test electrode layer, the electric leakage condition is tested, the same effect as that of a monitoring chip area is achieved, and the reliability of the semiconductor device is improved.

The invention provides an automobile controller testing mechanism which enables all function tests to be accurately and reliably carried out after a controller is arranged on the testing mechanism, saves testing time and improves testing accuracy. The device comprises a test installation plate which comprises a bottom limiting frame and two side positioning clamps, the bottom limiting frame is used for reliably positioning the bottom edge of the automobile controller, and the two side positioning clamps are used for installing and positioning the automobile controller in a profiling positioning area of the test installation plate; a liquid inlet port; a liquid outlet port; a high-voltage test interface; a low-voltage test interface; and an electric leakage test interface. A liquid inlet port is formed in the position, corresponding to a liquid inlet of the automobile controller, of the upper part of the test mounting plate, and a liquid outlet port is formed in the position, corresponding to a liquid outlet, of the automobile controller; the upper part of the test mounting plate is provided with a low-voltage test interface corresponding to the low-voltage connecting end of the automobile controller, and is provided with a high-voltage test interface corresponding to the high-voltage connecting end; the center of the front surface of the test mounting plate is provided with an electric leakage test interface.

The invention discloses a distribution network medium-voltage non-power-cut operation combined insulating partition plate and a using method thereof, and relates to the technical field of power system insulating partition plates, the partition plate comprises a high-strength insulating partition plate body, insulating handles are assembled on the two sides of the high-strength insulating partition plate body, a guide wire notch is formed in the side face of the high-strength insulating partition plate body, and a diversion clamp is installed at the notch; the handle is made of an anti-skid rubber material, and the flow guide clamp is connected to the guide wire notch through an adjustable buckle structure. In the use method, an operator needs to wear insulation protection equipment, assemble the isolation plates, mount and fix the isolation plates, ensure that the insulation resistance between the isolation plates meets a specified value, and perform voltage resistance and electric leakage tests at the same time. According to the combined insulating partition plate for medium-voltage non-power-failure operation of the distribution network and the use method of the combined insulating partition plate, by optimizing the structure and the use process of the partition plate, the insulating performance and the use safety of the partition plate are improved, the stability and the reliability of medium-voltage non-power-failure operation are effectively guaranteed, and the service life of the partition plate is prolonged.

The utility model discloses electric leakage testing equipment for a motor. The electric leakage testing equipment comprises a base; the first transverse moving assembly is arranged on the base, a first longitudinal moving assembly is arranged on the first transverse moving assembly, and a multi-angle rotating assembly is arranged on the first longitudinal moving assembly; the second transverse moving assembly is arranged on one side of the first transverse moving assembly, the second transverse moving assembly is arranged on the base, and a motor fixing assembly is arranged on the second transverse moving assembly; the utility model belongs to the technical field of motors, and particularly relates to a motor electric leakage test device. By designing the combination of the first transverse moving assembly, the first longitudinal moving assembly, the multi-angle rotating assembly, the second transverse moving assembly and the like, multi-angle detection of different positions of the fixing screws of the motor shell is realized.

The utility model provides a casual inspection system for a photovoltaic module, and belongs to the technical field of casual inspection of photovoltaic modules. The sampling inspection system comprises a thermostatic chamber; the cache frame is used for placing a photovoltaic module to be detected; each detection device comprises a 360-degree turnover inspection bench used for performing appearance inspection on the front and back surfaces of the photovoltaic module; the power test darkroom is internally provided with a power tester and is used for carrying out power test on the photovoltaic module; the insulation and voltage resistance tester is used for testing the insulation performance and the voltage resistance of the photovoltaic module; the EL tester is used for detecting internal defects of the photovoltaic module; a wet electric leakage testing instrument is arranged in the wet electric leakage testing pool, and the wet electric leakage testing pool is used for testing the moisture-proof performance and the electric leakage performance of the photovoltaic module; and the conveying device is connected with the cache frame and each detection device and is used for conveying the photovoltaic module. The off-line sampling detection system can be free from the influence of a production line, the detection efficiency is improved, and customer requirements are met.

The invention discloses an automatic test method and system for an automobile OBC, and relates to the technical field of new energy automobiles. The automatic test method and system for an automobile OBC include a harmonic distortion test module, a dynamic response test module, a leakage protection test module, and a test visualization module. By acquiring the current and voltage data of the OBC input terminal, analyzing the dynamic characteristics of the electrical waveform, and generating a harmonic distortion test report, the accuracy and efficiency of harmonic distortion detection are improved. The dynamic response test module applies different load changes, analyzes steady-state errors, overshoots, and undershoots, evaluates the dynamic response performance of the OBC, and ensures the response speed and reliability of the OBC in actual use. By performing a leakage test on the automobile OBC, the leakage current data is obtained, and the protection performance of the OBC under leakage conditions is evaluated to ensure compliance with safety standards and generate a test report. The visualization module intuitively displays the test results, which improves the efficiency and accuracy of the test.

The invention relates to the technical field of semiconductors, in particular to a memory array repairing method and a memory, the memory array repairing method comprises the following steps: executing an electric leakage test on a plurality of control lines in a memory array to obtain a first test result, the first test result comprising an electric leakage characterization value of each control line, the leakage characterization value is used for characterizing whether the leakage current value of the corresponding control line is greater than a leakage threshold; unit starting testing is carried out on a plurality of storage units in the storage array, a second testing result is obtained, and the second testing result comprises the number of electric leakage units on each control line; obtaining a replacement address based on the first test result and the second test result; repairing the replacement address by using a redundant address, wherein the redundant address is a control line address corresponding to the redundant array; and repairing the replacement address by using a redundant address, wherein the redundant address is a control line address corresponding to the redundant array. The memory array repairing method provided by the invention aims to improve the utilization rate of redundant resources in a memory.

The invention provides an electric leakage safety detection system for electronic and electric appliances, and relates to the technical field of electric leakage detection, the electric leakage safety detection system comprises a mounting seat, a detector is fixed on the surface of the mounting seat, two connecting plugs are arranged on the bottom surface of the detector, a connecting wire is fixed at the outer end of each connecting plug, and a contact head is fixed at the other end of each connecting wire. The bottom of the mounting seat is provided with a detection assembly, the detection assembly comprises an annular sliding rail, the top of the annular sliding rail is fixedly connected with the mounting seat, two sliding blocks are slidably mounted in the annular sliding rail, the contact head is mounted on the surfaces of the sliding blocks, and the contact head is close to the three-wire plug through a pushing assembly. After the plug is clamped, the plug is pulled out of the socket to be close to the detector, two contact heads in the detection assembly make contact with metal sheets of the three-wire plug, electric leakage testing is carried out on the three-wire plug, direct manual contact with the plug can be avoided in the process, and meanwhile electric leakage detection is more convenient by pulling out the plug to be close to the detector.

The utility model relates to the technical field of electrical products, in particular to a sealed leakage protection plug. The utility model provides a sealed electric leakage protection plug, which comprises an upper cover, a bottom cover, bolts, a circuit board, a power line, a starting button, a sliding rod and a starting assembly, the upper cover is connected with the bottom cover through a plurality of bolts, the circuit board is arranged in the upper cover, and the power line electrically connected with the circuit board is arranged between the upper cover and the right side of the bottom cover. A starting button is arranged on the upper cover in a sliding mode, a sliding rod is fixedly connected to the bottom of the starting button, two inserting pieces penetrate through the bottom cover, and a starting assembly used for connecting an inserting piece circuit is arranged between the circuit board and the bottom cover. The sealing cover plate presses the silica gel sheet so that the upper cover is sealed with the electric leakage test button and the start button, and the purpose of sealing and water proofing of the plug is achieved.

The invention discloses a semiconductor device, a device preparation method and a device test method, which are applied to the field of semiconductor device detection, and each group of electric leakage test electrodes at least comprises a first test electrode, a second test electrode and a third test electrode; the first test electrode is arranged on the first surface of the first to-be-tested functional layer, and the first end of the second test electrode is exposed out of the first surface; the second end of the second test electrode is exposed out of the second surface, and the conductive connection structure is arranged on the first test electrode in the stacking direction, is mapped on a mapping area formed on the second surface and is conductively connected with the third test electrode; the second surface and the first surface are correspondingly exposed out of the two opposite ends of the third test electrode. According to the structure, when the same voltage is applied to the first test electrode and the third test electrode, the first test electrode and the third test electrode are equipotential, the influence of electric leakage in the vertical direction on detection can be separated, and then the surface electric leakage condition of the to-be-detected functional layer is accurately detected.

The invention provides an electric leakage processing method for a storage chip, and the method comprises the steps: obtaining an electric leakage test result of a plurality of test chips before the storage bit area is reduced, an electric leakage test result of the plurality of test chips after the storage bit area is reduced, and a function test result of the plurality of test chips after the storage bit area is reduced, determining a plurality of to-be-optimized chips with the problem of electric leakage from a grid electrode to a drain electrode; according to a to-be-selected processing technology corresponding to each to-be-optimized chip, injecting a phosphorus element into a grid electrode of each to-be-optimized chip to obtain an optimized chip corresponding to each to-be-optimized chip; and performing tape-out verification on each optimized chip to obtain a verification result corresponding to each optimized chip, and determining a target processing technology from the plurality of to-be-selected processing technologies according to each verification result so as to perform chip production by using the target processing technology. The problem of electric leakage from the grid electrode to the drain electrode can be effectively reduced, and the yield and reliability of products are guaranteed.

An electrical leakage test structure and an electrical leakage testing method are disclosed. The electrical leakage test structure comprises: a substrate; a first well region and a second well region, which are both formed in the substrate; a first shallow trench isolation structure formed between the second and first well regions; a first source / drain region formed in the first well region; a plurality of second source / drain regions formed in the second well region; and a test gate formed on the substrate. In the electrical leakage testing method, a plurality of electrical leakage test structures with different designed dimensions are tested to perform leakage current evaluation on each electrical leakage test structure, and a designed dimension vs. leakage current relationship is developed based on the leakage current evaluation on each electrical leakage test structure, which reflects whether the internal design of a corresponding semiconductor device is associated with any problem such as parasitic leakage.

The utility model relates to the technical field of products of miniature electric leakage protection circuit breakers for household and similar purposes, in particular to an electric leakage test structure of a circuit breaker. The circuit breaker comprises a circuit breaker shell, wherein a cam lever, a phase pole moving contact elastic sheet, a circuit board contact body, an electromagnetic frame and a test button penetrating through the shell are arranged in the shell; the cam lever comprises a fulcrum cam at the central part and a left lever arm and a right lever arm at the left side and the right side of the fulcrum cam, the left lever arm is in linkage with the bottom end of the test button, and the right lever arm supports the phase pole moving contact elastic sheet; one end of the phase pole moving contact elastic sheet is clamped in the shell and is electrically contacted with the electromagnetic frame, and the other end of the phase pole moving contact elastic sheet is contacted or disconnected with the circuit board contact body; and when the test button moves downwards, the linkage phase pole movable contact elastic sheet tilts upwards to be in contact with the circuit board contact body to be conducted to form an electric leakage test loop. According to the utility model, the button stroke is small, so that the operation of a user is more reliable, sensitive and safe, and the design space in the product is more flexible and abundant.

The invention provides a light emitting diode and a light emitting device. The light-emitting diode comprises a substrate, wherein the substrate is provided with a first surface and a second surface which are oppositely arranged; a semiconductor laminated layer, a first electrode and a second electrode are arranged above the first surface of the substrate; a third electrode is arranged below the second surface of the substrate; the polarity of the first electrode is opposite to that of the second electrode, and the polarity of the first electrode is opposite to that of the third electrode; the first electrode and the second electrode are conducted with the test circuit; the first electrode and the third electrode are conducted with the working circuit. The first electrode and the second electrode are arranged on the same surface of the light-emitting diode, so that after the light-emitting diode is cut and before the light-emitting diode is packaged, a mature and popular standard spot measurement device in the industry can be used for directly carrying out rapid and lossless electric leakage test on the light-emitting diode, defective products are effectively screened out, and the yield and the reliability of the products are improved.

The application discloses a mine switch leakage testing device and a use method thereof, and belongs to the field of mine switch leakage testing devices. The device comprises a quick plug connecting post, a power switch SA, a knob S1, a knob S2, a millisecond timer JSQ, a testing button QA-1, a testing button QA-2, a power indicator lamp HL, a transformer BK and resistors R1-R5. The device can test the reduction of the insulation of the load side of a switch, test whether the switch protection is in action when a human body contacts a live body, test the leakage locking resistance value of the switch, and comprehensively test the performance of the protector, the protection components and the protection circuit.

The invention relates to the technical field of solar cells, and provides an electric leakage test method and device for a solar cell and a storage medium, and the method comprises the steps: obtaining a plurality of gray images of the solar cell; the illumination intensities corresponding to the grayscale images are different; for each grayscale image, determining a related parameter of a first pixel point and a related parameter of a second pixel point of the grayscale image; the first pixel points are pixel points in a target color gradation range; the second pixel points are pixel points outside the target color gradation range; the related parameters comprise an average gray value and the number of pixel points; according to the related parameters of the first pixel points and the related parameters of the second pixel points of each gray level image, determining the parallel resistance of the solar cell; and under the condition that the parallel resistor is out of the preset range, determining that the solar cell leaks electricity. Therefore, the problem of voltage bias of the metal probe and the electrode in the electric leakage test of 0BB and pseudo 0BB type solar cells can be solved, and the reliability of the electric leakage test of the solar cells is further improved.

The invention provides an electric leakage test structure and method, and belongs to the technical field of semiconductors, and a first to-be-tested structure and a second to-be-tested structure each comprise a first electrode and a second electrode; each of the first interconnection structure and the second interconnection structure comprises a first interconnection piece and a second interconnection piece; a distance is formed between the first interconnection piece of the first interconnection structure and the first electrode of the first to-be-tested structure, and the second interconnection piece of the first interconnection structure is electrically connected with the second electrode of the first to-be-tested structure; the first interconnection piece and the second interconnection piece of the second interconnection structure are electrically connected with the first electrode and the second electrode of the second to-be-tested structure respectively; the first interconnector and the second interconnector are respectively used for receiving a first voltage and a second voltage, and the absolute value of the first voltage is greater than that of the second voltage. The leakage current obtained by the test can eliminate parasitic leakage current, the test result is close to the real leakage current of the to-be-tested structure, the test accuracy is remarkably improved, and the space of a cutting channel can be saved.

The utility model discloses an electric leakage test lamp holder seat for a bulb, which is uniformly fixed on a transmission chain and comprises a chain fixing plate seat, a test lamp holder fixed on the chain fixing plate seat and a short-circuit switch fixed on the chain fixing plate seat, and the short-circuit switch is electrically connected with the test lamp holder; a concave cavity with an opening in the top face is formed in the chain fixing plate base, and a U-shaped groove hole communicated with the concave cavity is formed in the top face of the chain fixing plate base. The test lamp holder and the chain fixing plate seat are sequentially overlapped and are fixed through a screw rod; and the bottom surface of the chain fixing plate seat is fixed on the conveying chain. According to the utility model, the structure arrangement is reasonable, the continuous test operation can be realized in the conveying process of the conveying chain, the test efficiency is improved, the test lamp holder and the short-circuit switch are arranged on the top surface of the chain fixing plate seat, and whether the chain is short-circuited is detected through the short-circuit switch, so that the short-circuit detection efficiency and precision are improved, and the production cost is reduced. The overall structure is simple, and the detection cost can be reduced.

The present application relates to a kind of for the judgment method of the micro-discharge risk of traveling wave tube collector, belong to the technical field of high-power electric vacuum device research;Obtain the voltage difference of two adjacent electrodes of traveling wave tube collector;The leakage test of different high voltage is carried out to any two adjacent electrodes of traveling wave tube collector, obtain the data of voltage difference and current, convert the data of voltage difference and current into new data expression form;According to new data expression form, draw data curve;The data in data curve is segmented linear fitting, obtains positive slope straight line and negative slope straight line;And find the corresponding abscissa value of each inflection point, obtain the voltage value V of inflection point corresponding;Judge the risk size of micro-discharge between the two adjacent electrodes;And complete the risk size of micro-discharge of entire traveling wave tube collector;The result of the present application can be used to evaluate the possibility of micro-discharge of traveling wave tube, carry out early screening to the micro-discharge of traveling wave tube, improve the screening efficiency of traveling wave tube product.

The temperature control method comprises the steps that the temperature of a first fluid in a double-circulation system is obtained, the double-circulation system comprises the first fluid and a second fluid, the specific heat capacity of the first fluid is smaller than that of the second fluid, and the first fluid is used for exchanging heat with the second fluid; determining a second target temperature of the second fluid according to the deviation between the temperature of the first fluid and the first target temperature; and according to the deviation between the second target temperature and the temperature of the second fluid, the temperature of the second fluid is controlled, so that after the second fluid exchanges heat with the first fluid, the deviation between the temperature of the first fluid and the first target temperature is smaller than a preset temperature threshold value. According to the temperature control method provided by the embodiment of the invention, the accuracy and the response speed of temperature control of the first fluid are improved, and the accuracy and the reliability of a wet leakage test of the photovoltaic module are ensured.

This application relates to the general field of electrical variable measurement technology, specifically to a leakage current testing method for a mine-use combined low-voltage power supply system. The method includes: slicing a data sequence collected within a preset time period to obtain multiple sub-sequences corresponding to slice windows; performing feature extraction on the sub-sequences corresponding to each target circuit in operation to obtain the system characteristics of the mine-use combined low-voltage power supply system within the slice window; determining a target scene based on the matching results of the system characteristics of the slice window with multiple preset scene features; performing theoretical capacitance current separation on the zero-sequence current contained in the sub-sequences of the circuit based on the target scene to obtain the residual current at each sampling point in the sub-sequences of the circuit; and determining the leakage current test result of the mine-use combined low-voltage power supply system within the slice window corresponding to the sub-sequence based on the changing trend of the residual current in the sub-sequences of the circuit.

The invention discloses an integrated circuit test method, and belongs to the technical field of semiconductors, and the method comprises the steps: 1, feeding: preparing a to-be-detected product; 2, performing a conventional electrical test on the product: placing the product in a temperature testing machine to complete the conventional electrical test; 3, AOI detection: detecting whether the product identification or appearance is damaged, and screening test waste products; and step 4, FT2 testing: performing open and short circuit testing and electric leakage testing on the product through a testing machine. According to the invention, by developing a test machine platform program and adding open and short circuit test and electric leakage test, abnormal units with packaging cracks are screened out before the product enters the carrier tape, and test escape is avoided.

The present invention aims to provide a multi-channel test circuit suitable for measuring the leakage characteristic curve of a chip. The present invention includes an MCU module, a digital analog converter, an analog digital converter, an amplifier circuit, a feedback circuit, an electronic switch, an analog switch, a reverse circuit, a calibration loop, a digital multimeter, a range switching circuit, a matrix switch, and a differential sampling circuit. The MCU module is connected to the amplifier circuit via a digital analog converter, and the output end of the amplifier circuit is divided into three paths, one of which is connected to the analog switch via a reverse circuit, two of which are connected to the range switching circuit, and three of which are connected to the electronic switch via a feedback circuit. The analog switch is divided into two paths, one of which is connected to the range switching circuit, and two of which are connected to the digital multimeter via a calibration loop. The range switching circuit is divided into two paths, one of which is connected to the circuit under test via a matrix switch, and two of which are connected to the analog digital converter via a differential sampling circuit. The electronic switch is connected to the MCU module via an analog digital converter. The present invention is applied to the technical field of leakage testing.

A leakage test module, comprising a leakage test circuit and a circuit board powered by a main circuit, the leakage test circuit comprising a test button, a first elastic member and a second elastic member, the first elastic member and the second elastic member cooperating to form a breaking point of the leakage test circuit, the first elastic member being in contact with the second elastic member when the test button is pressed and the first elastic member is elastically deformed, the leakage test circuit further comprising a terminal block, the second elastic member being connected with the terminal block and the circuit board, and the terminal block being connected with the main circuit as a common power supply terminal of the leakage test circuit and the circuit board. A circuit breaker, comprising a housing and at least one circuit breaker pole arranged in the housing, and further comprising the leakage test module as described above. The terminal block is used as a power supply terminal of the circuit board and the leakage test circuit, and the second elastic member not only forms the breaking point but also connects the circuit board and the terminal block together, thereby reducing the amount of wires used, and having the advantages of simple structure, high reliability and small space occupation.

A circuit breaker comprises a shell and an electric leakage protection module, the electric leakage protection module comprises an electric leakage testing mechanism and a circuit board, the electric leakage testing mechanism comprises a testing button and an electric leakage testing loop, the testing button is in sliding fit with the shell, and the electric leakage testing loop is connected into a phase L-pole main circuit and an N-pole main circuit in the shell. The electric leakage test loop comprises a conductive elastic piece and a static contact piece which form a breakpoint, two electricity taking grooves are formed in the edge of the circuit board, the first electricity taking end of the conductive elastic piece and the second electricity taking end of the static contact piece are clamped in the two electricity taking grooves respectively and electrically connected with the circuit board, and the test button is connected with the conductive elastic piece. And the test button drives the movable contact part of the conductive elastic sheet to be close to or far away from the static contact part of the static contact sheet. According to the utility model, the conductive elastic sheet and the static contact sheet which form the breakpoints are respectively clamped in the clamping grooves at the edge of the circuit board, and the conductive elastic sheet and the static contact sheet are directly connected with the circuit board to take electricity, so that wires connected between the conductive elastic sheet and the circuit board and between the static contact sheet and the circuit board are omitted, and the number of the wires is reduced.

The utility model belongs to the technical field of solar photovoltaic module testing, and particularly relates to a wet electric leakage testing water tank which comprises a rack, a water tank body is supported on the rack, a side frame used for installing an air cylinder fixing plate is arranged at the corner of the rack, a lifting assembly is installed on the air cylinder fixing plate, and the lifting assembly is connected with a water tank body. An air cylinder in the lifting assembly is in driving connection with a bracket, and the bracket is located on the inner side of the water tank. The steel structure rack formed by welding is adopted, so that the stability and the bearing capacity of the whole structure are ensured; the bracket is driven by the air cylinder to ascend and descend, the function that the solar cell chip is automatically submerged into water to be tested is achieved, the detection efficiency is improved, and the risk that unnecessary physical damage is caused to the chip is reduced.