Discharging method and device of capacity fall-off tester

A capacitance leakage and tester technology, which is applied to the components of electrical measuring instruments, measuring devices, instruments, etc., can solve problems such as arcing, mechanical vibration, high voltage and high current, and digital control system interference, so as to prevent mechanical vibration and high voltage The effect of high current arcing phenomenon

Active Publication Date: 2011-08-31
UNI TREND TECH (CHINA) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For the discharge stage, the previous capacitor leakage testers used mechanical switches to discharge, and the defect of this circuit is that it completely uses mechanical switches to discharge, which will generate instantaneous high voltage and high current in the initial stage of discharge, resulting in mechanical jitter and high voltage and large current. The phenomenon of arcing, when the capacitor has a large voltage, the discharge will cause great interference to the digital control system of various instruments, resulting in crashes, resets, and even more serious consequences. For digital instruments that are accurately measured or controlled, Or for instruments that require continuous work, this consequence is very unfavorable to the corresponding working process

Method used

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  • Discharging method and device of capacity fall-off tester
  • Discharging method and device of capacity fall-off tester
  • Discharging method and device of capacity fall-off tester

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Embodiment Construction

[0019] see figure 1 and figure 2 , the discharging method of a kind of capacitance leakage tester of the present invention, it comprises the steps:

[0020] 1) a microprocessor-controlled discharge selection switch, electronic discharge circuit, mechanical discharge circuit and measured capacitance are set, and the discharge selection switch controlled by the microprocessor connects the measured capacitance to the electronic discharge circuit or the mechanical discharge circuit;

[0021] 2) judging the voltage of the measured capacitor Cx;

[0022] 3) When the voltage of the measured capacitor is higher than the reference value set by the VREF terminal of the comparator, the discharge selection switch terminals CTL_1 and CTL_2 controlled by the microprocessor switch the measured capacitor to the electronic discharge circuit for discharging;

[0023] 4) When the voltage of the measured capacitor is lower than or equal to the set reference value of the VREF terminal of the co...

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Abstract

The invention provides a discharging method of a capacity fall-off tester. In the discharging method, mechanical discharging is adopted after electronic discharging, momentary large voltage and large current are not generated at the initial discharging stage, so that the arcing phenomena of mechanical dithering, large voltage and large current are avoided. The invention also provides a device forthe method. The device comprises a discharging selection switch, an electronic discharging circuit, a mechanical discharging circuit, a voltage comparator and a tested capacitor controlled by a microprocessor, wherein two ends of the tested capacitor are connected to the electronic discharging circuit and the mechanical discharging circuit. By adopting the device, the results such as machine halt, resetting and the like caused by the disturbance of various instruments on a digital control system during capacitor discharging can be avoided.

Description

technical field [0001] The invention relates to a capacitance tester, in particular to a discharge method and device for a capacitance leakage tester. Background technique [0002] In various electronic and mechanical industries, various products contain capacitive components. For example, when performing certain process tests such as capacitance testing, it is necessary to test the leakage of the capacitance. The detection of a general capacitance leakage tester includes three stages: charging the measured capacitor, testing the leakage of the measured capacitor, and discharging the measured capacitor. For the discharge stage, the previous capacitance leakage testers used mechanical switches to discharge, and the defect of this circuit is that it completely uses mechanical switches to discharge, which will generate instantaneous high voltage and high current in the initial stage of discharge, resulting in mechanical jitter and high voltage and large current. The phenomenon...

Claims

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Application Information

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IPC IPC(8): G01R1/00
Inventor 高丽李毓宏
Owner UNI TREND TECH (CHINA) CO LTD
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