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Cyclic aging test and data collection method, system and medium

A aging test and data collection technology, applied in the field of testing, can solve the problems of unknown completion time, limited time, and inability to flexibly control the aging test, so as to achieve the effect of increasing work efficiency and reducing operation time

Pending Publication Date: 2021-04-09
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the single-round test time of the customized test program is limited, ranging from several hours to tens of hours, which often cannot meet the needs of long-term aging tests, so multiple rounds of cyclic tests are required; the completion time of each round of the customized test program is unknown, The traditional method cannot perform the next round of testing in a timely manner after a single round of testing is completed; the duration of each round of testing of the customized test program is different according to the configuration of the server under test, and the traditional method cannot flexibly control the aging test with a specified total duration for different configurations
[0003] The current burn-in test method is to configure the burn-in test environment and run the burn-in test script. At this stage, there is no method that can automatically select the burn-in test script according to the machine type and collect the burn-in test data results.

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  • Cyclic aging test and data collection method, system and medium
  • Cyclic aging test and data collection method, system and medium

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Embodiment Construction

[0041] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0042] Embodiments of the invention include:

[0043] See figure 1 , in a first aspect, a method for cyclic aging testing and data collection, comprising:

[0044] First, deploy the environment:

[0045] Build a PXE central server based on DHCP, HTTP, TFTP, NFS and other technologies;

[0046] The burn-in test main directory and the burn-in test data directory are stored in the PXE central server; the burn-in test main directory contains test tools for different types and models; the burn-in test data directory stores the data generated by the burn-in test on the server to be tested;

[0047] Share the aging test subject and aging test data th...

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Abstract

The invention discloses a cyclic aging test and data collection method. The method comprises the following steps: deploying a test environment; selecting an aging test program according to the aging test configuration information, and executing an aging test; circularly detecting whether the aging test is abnormal or not; if no abnormality occurs during the aging test, calculating the test time; judging whether the test result log file or the aging test is abnormal or not; if an abnormal keyword exists in the test result log file or an exception occurs during the aging test, reserving the current test environment; if the abnormal keyword does not exist in the test result log file, no abnormality occurs during the aging test, and the accumulated test time is less than the total test time, entering the next round of aging test; and collecting data. According to the invention, cyclic aging test and test data collection can be carried out on the server, automatic test deployment, cyclic test and data interaction mechanisms are optimized, and great convenience is provided for long-time regular cyclic aging test requirements in server test.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a method, system and medium for cyclic aging testing and data collection. Background technique [0002] At present, in the process of customized testing for servers, there are long-term aging test requirements ranging from several days to dozens of days. However, the single-round test time of the customized test program is limited, ranging from several hours to tens of hours, which often cannot meet the needs of long-term aging tests, so multiple rounds of cyclic tests are required; the completion time of each round of the customized test program is unknown, The traditional method cannot perform the next round of testing in a timely manner after a single round of testing is completed; the duration of each round of testing of customized test programs is different according to the configuration of the server under test, and the traditional method cannot flexibly control the aging t...

Claims

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Application Information

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IPC IPC(8): G06F11/22
CPCG06F11/2273
Inventor 李园园
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD