Encapsulated memory restoration method and device, storage medium and electronic equipment

Abstract

The invention relates to a packaged memory restoration method and device, a computer readable storage medium and electronic equipment, and the method comprises the steps: writing the failure information of a memory into an SPD in a memory testing process, wherein the failure information comprises a failure address; after the equipment is started, reading the failure address from the SPD, and determining the number of failure lines where the failure address is located; when the number of the failure lines is smaller than or equal to the number of redundant lines, adopting the redundant lines to repair the failure lines; and when the number of the failure lines is greater than the number of the redundant lines, loading the failure information into a register. According to the method and the device, the failure address is completely repaired.

Description

technical field [0001] The present disclosure relates to the technical field of integrated circuits, in particular, to a packaged memory repair method and device, a computer-readable storage medium, and electronic equipment. Background technique [0002] A computer system generally consists of five parts: a processor, a memory, an input device, an output device, and a bus. Among them, the memory is used to store instructions and data required for the processor to run. The memory is generally realized by using a dynamic random access memory (Dynamic Random Access Memory, DRAM) of a semiconductor process. [0003] A DRAM typically includes one or more arrays of memory cells, each memory cell array including memory cells arranged in a matrix of rows and columns. DRAMs also typically include redundant memory cells that can be used to functionally replace failed memory cells in the memory cell array. [0004] However, since the redundant storage units available in each bank gro...

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Problems solved by technology

[0006] The purpose of the present disclosure is to provide a packaged memory repair method and device, computer-readable storage medium, and electronic equipment, so as to overcome the problem that all repair operations of failed storage units cannot be realized at least to a certain extent

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