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Heavy ion beam current real-time monitoring device and irradiation test system

A heavy ion beam, real-time monitoring technology, applied in the field of heavy ion detection, can solve the problems of low monitoring efficiency, inconvenient replacement of apertures, narrow fluence rate detection range, etc. The effect of large-scale monitoring of rate and uniformity

Active Publication Date: 2021-04-20
CHINA INSTITUTE OF ATOMIC ENERGY
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Problems solved by technology

[0004] In order to solve the technical problems in the prior art that the fluence rate detection range is narrow due to the fixed aperture of the aperture, and the use of a penetrating thin-film detector will affect the beam current monitoring effect, and the replacement of the aperture is inconvenient and the monitoring efficiency is low. The present disclosure provides a heavy ion beam current real-time monitoring device and an irradiation test system

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  • Heavy ion beam current real-time monitoring device and irradiation test system
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  • Heavy ion beam current real-time monitoring device and irradiation test system

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Embodiment Construction

[0035]In order to make the objects, technical solutions, and advantages of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings.

[0036]It should be noted that in the figures or instructions, unluckled or described implementations are the form known in the art of ordinary skill in the art, and is not described in detail. Further, the definition of each of the elements and methods is not limited to various specific structures, shapes, or methods mentioned in the embodiments, and those skilled in the art can simply change or replace them.

[0037]It will also be noted that the direction term mentioned in the examples, such as "upper", "lower", "front", "post", "left", "right", etc., is only the direction of the accompanying drawings, not It is used to limit the scope of protection of the present disclosure. Throughout the drawings, the same elements are represented by the same or similar reference numerals. The c...

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Abstract

The invention provides a heavy ion beam current real-time monitoring device and an irradiation test system. The heavy ion beam current real-time monitoring device comprises a detection structure and a diaphragm structure. The detection structure comprises a plurality of detectors used for monitoring heavy ion beam current in real time; the diaphragm structure is arranged in front of the detection structure along the incident path of the heavy ion beam current; the diaphragm structure comprises a diaphragm piece, the diaphragm piece comprises a plurality of detection diaphragm groups which are arranged in the diaphragm piece in a penetrating manner, wherein each detection diaphragm group comprises a plurality of detection diaphragms with different apertures, and one detection diaphragm group corresponds to one detector in a plurality of detectors; and the diaphragm piece rotates by taking the center line of the diaphragm piece as a rotating shaft so as to switch one detection diaphragm with different apertures in one detection diaphragm group to correspond to one detector. By utilizing the device disclosed by the invention, the fluence rate and uniformity of the heavy ion beam current can be monitored in real time in a large range in the sample irradiation process, the monitoring accuracy is high, the diaphragm does not need to be frequently disassembled and assembled to be replaced in the irradiation process, and the test efficiency is greatly improved.

Description

Technical field[0001]The present disclosure relates to the field of heavy ion detection, and more particularly to a real-time monitoring device and an irradiation test system for heavy ion beam current.Background technique[0002]In the prior art, the single-particle effect irradiation experiment for the heavy ion is mostly used to make beam monitoring in the manner of placing a bundled aperture in the front end of the detector. The beam diagnostic system of the irradiation device in the prior art is mainly taken to monitor the size and uniformity of the quantity rate in real time in the outer side of the beam line. For example, a plastic thin film scintillator detector is mounted on the beam flow line, the film detector thickness, which can take a small portion of the energy to achieve real-time monitoring of the beam flow when wearing a thin film. However, all the restricted apertures in the prior art are fixed apertures, and the range of quasiors measured by the detector is narrowe...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/29G01T7/00
Inventor 陈启明郭刚史淑廷沈东军刘建成孔福全孙浩翰
Owner CHINA INSTITUTE OF ATOMIC ENERGY