A portable emissivity measurement device and its measurement module

Abstract

A measuring module of a portable emissivity measuring device disclosed in the present invention comprises: a light source, an aperture arranged on the light output path of the light source, and a light chopper; an ellipsoid reflector with a first focus and a second focus, through which and the light beam of the chopper is reflected from the first focal point to the second focal point through the ellipsoidal reflector; the parabolic reflective mirror is used to receive and reflect the light beam emitted from the second focal point, and the focal point of the parabolic reflective mirror coincides with the second focal point to divide the light beam Forming a detection beam; an integrating sphere with an entrance and a measurement port, the detection beam can be irradiated on the target surface through the entrance and the measurement port and reflected to the inner surface of the integrating sphere; an infrared detector for receiving reflected light from the inner surface of the integrating sphere, infrared The detection head of the detector is arranged inside the integrating sphere. In the invention, the detection light beam can be formed into parallel light, which effectively improves the measurement accuracy and improves the portability of the whole machine.

Description

technical field [0001] The invention relates to the field of emissivity measurement, in particular to a portable emissivity measurement device and a measurement module thereof. Background technique [0002] Emissivity is an important basic parameter to characterize the radiation performance of materials in the infrared band. Emissivity measurement technology is widely used in many industrial fields such as radiation temperature measurement, material detection, intelligent identification, and feature control. At present, the measurement methods of infrared emissivity of materials are mostly desktop or larger equipment, and the specific measurement is to obtain the infrared emissivity data of materials by preparing samples and sending them to the laboratory for measurement. Considering that the infrared emissivity of materials is very sensitive, it can be greatly changed by environmental influence and natural aging. The current measurement method has the following limitations....

AI Technical Summary

Problems solved by technology

However, due to the relative divergence of the light beams irradiated on the target surface in the prior art, it is impossible to accurately measure the reflectance of the target surface based on the divergent light

In addition, for the divergent detection beam, it is necessary to strictly limit the beam path entering the integrating sphere and the position of the measuring port of the integrating sphere (the target to be measured attached to the measuring port), which is not conducive to controlling the size of the whole machine and affecting portability Sex, and if in order to improve portability, the measurement accuracy will also be affected to a certain extent

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