Method for measuring residual stress of polycrystalline material in X-ray diffraction full-spectrum multi-peak fitting mode

Abstract

The invention provides a method for measuring residual stress of a polycrystalline material in an X-ray diffraction full-spectrum multi-peak fitting mode. The method comprises the following steps: obtaining plane strain of a polycrystalline material by utilizing an X-ray diffraction full-spectrum spectral line of the material and adopting a multi-peak fitting mode on the basis of considering polycrystalline grain orientation, and combining the stress-strain relationship of the polycrystalline material on the basis, and finally calculating the residual stress value of the polycrystalline material. According to the method, multiple pieces of diffraction peak information are adopted in the material strain calculation process, the grain orientation of the polycrystalline material is considered, the influence of preferred orientation of the polycrystalline material on a traditional X-ray diffraction stress analysis method is avoided, and the convenient and rapid method is provided for measuring the residual stress of the polycrystalline material.

Description

technical field [0001] The invention relates to the technical field of analysis and testing, in particular to a method for measuring residual stress of polycrystalline materials in X-ray diffraction full-spectrum multi-peak fitting mode. Background technique [0002] During the production, handling or processing of materials, residual stresses are generated in materials due to inhomogeneous deformation of local areas of materials. Appropriate residual stress distribution can be a favorable factor to improve the performance of materials. For example, through shot peening technology, a residual compressive stress field is formed on the surface of the metal workpiece, which can effectively improve the service life of the workpiece. Therefore, in order to make better use of residual stress to optimize material performance, it is necessary to detect and control the residual stress of materials in each process of production. [0003] X-ray diffraction technology has a relatively...

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Problems solved by technology

P.J.Withers et al. published " "Overview-Residualstress Part 1-Measurmenttechniques" paper summarizes the method and shortcomings of X-ray diffraction method for measuring residual stress. If there is texture in the material, the result of traditional X-ray diffraction method for measuring residual stress will produce large errors

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