A non-digital optomechanical sinusoidal stripe structured light high-precision three-dimensional measurement device

Abstract

The invention relates to the field of optical three-dimensional imaging, in particular to a non-digital optomechanical sinusoidal stripe structured light high-precision three-dimensional measuring device. The structured light field projection device includes N structured light projection modules, light combining prisms and projection lens groups. The structured light projection modules are turned on in sequence according to a predetermined sequence to generate N sinusoidal stripe structured light fields; The sine-stripe structured light field is converted into the light path and output to the projection lens group; the projection lens group is used to project N sine-striped structured light fields to the same target to be measured; among them, when N sine-striped structured light fields are projected to the same target , have the same imaging position, and there is a spatial phase interval of 2π / N between the temporally adjacent sinusoidal fringe structured light fields. By using the structured light field projection device and the three-dimensional imaging system of the present invention, the three-dimensional data of the face target can be acquired with high speed and high precision.

Description

technical field [0001] The invention relates to the field of optical three-dimensional imaging, in particular to a non-digital optomechanical sinusoidal stripe structured light high-precision three-dimensional measuring device. Background technique [0002] The premise of the rapid application of 3D face recognition technology is the establishment of large-scale 3D face data. Optical 3D measurement technology based on the principle of triangulation has significant advantages such as non-contact in the whole field, high precision, and fast speed. One of the technologies respected by high-precision 3D face data. The principle of using optical 3D measurement to obtain 3D face data is as follows: project a structured light field onto the surface of the face to be measured, and use a monocular or binocular camera to capture a sequence of deformed images modulated by the surface of the face to be measured. The image sequence extracts phase information to obtain 3D face data and r...

AI Technical Summary

Problems solved by technology

[0003] Among them, the three-dimensional measurement technology based on sinusoidal fringe projection can obtain excellent modeling results, but the sinusoidal fringe sequence requires precise phase shift, and commercial digital projection equipment such as DLP (Digital Light Processing) and LCOS (Liquid Crystalon Silicon) are usually used. Low frame rate, large size, and high cost are limited in 3D face recognition applications that need to balance factors such as accuracy, measurement speed, integration, and cost

At present, there is no report of a low-cost high-speed and high-precision structured light 3D imaging system that can meet the requirements of face 3D data acquisition.

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