In-situ comprehensive measurement method and device for thermoelectric performance of micro-nano material based on harmonic detection
A technology of micro-nano materials and thermoelectric properties, applied in the direction of measuring devices, material thermal development, material thermal conductivity, etc., can solve problems such as inability to accurately measure thermoelectric merits, achieve high measurement accuracy and efficiency, eliminate measurement errors, eliminate The effect of radiation heat loss
Pending Publication Date: 2021-06-01
INST OF ENGINEERING THERMOPHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology
[0004] In order to solve the problem that the existing technology cannot accurately measure the thermoelectric figure of merit, the present invention proposes a method and device for in-situ comprehensive measurement of thermoelectric properties of micro-nano materials based on harmonic detection, which can target the same micro-nano sample (film or fiber) , direct and in-situ one-time accurate measurement of ZT, thermal conductivity, electrical conductivity, Seebeck coefficient and thermal diffusivity of the sample
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[0029] In order to better understand the present invention, the content of the present invention is further illustrated below in conjunction with the examples, so that the advantages and features of the present invention can be more easily understood by those skilled in the art. It should be noted that the following descriptions are only preferred embodiments of the present invention, but the content of the present invention is not limited to the following embodiments. In fact, it will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the scope or spirit of the invention. For example, features illustrated or described as part of one embodiment can be used with another embodiment to yield a still further embodiment. Therefore, it is intended that the present invention cover such modifications and variations as come within the scope of the appended claims and their equivalents.
[0030] ...
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Abstract
The invention discloses an in-situ comprehensive measurement device and method for thermoelectric performance of a micro-nano material based on harmonic detection. The in-situ comprehensive measurement device comprises a measurement and control system, an industrial personal computer and a high-vacuum constant-temperature cabin. The ZT, the conductivity, the thermal conductivity, the thermal diffusivity and the Seebeck coefficient of the same sample can be directly and accurately measured at a time by measuring phase angles, fundamental waves and harmonic voltages at the two ends of the sample and the adjustable resistance box under different frequencies and combining the boundary dimension of the sample measured by a microscope, and the parameters have no dependency relationship, measurement errors and even wrong results caused by multiple times of sample preparation are eliminated, and the measurement precision and the measurement efficiency are higher.
Description
technical field [0001] The invention belongs to the field of thermoelectric materials, and in particular relates to an in-situ comprehensive measurement method and device for thermoelectric properties of micro-nano materials based on harmonic detection. Background technique [0002] Thermoelectric material is a kind of non-polluting green energy material that uses thermoelectric effect to directly convert heat energy and electric energy. With the rapid development of nanotechnology, the thin film and fiberization of thermoelectric materials through nanotechnology can not only greatly improve their thermoelectric efficiency, but also can be widely used in the medical field, military field and human body temperature monitoring. The thermoelectric conversion efficiency of thermoelectric materials is generally measured by the thermoelectric figure of merit (ZT), but there is currently no method and equipment that can directly measure the thermoelectric figure of merit in the wor...
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IPC IPC(8): G01N27/00G01N25/20G01N25/18
CPCG01N27/00G01N25/20G01N25/18
Inventor 郑兴华张挺杨啸陈海生
Owner INST OF ENGINEERING THERMOPHYSICS - CHINESE ACAD OF SCI