Method and device for direct in-situ comprehensive measurement of thermoelectric properties of micro-nano material
A technology for comprehensive measurement and micro-nano materials, which is applied in the field of direct in-situ comprehensive measurement of thermoelectric properties of micro-nano materials, can solve problems such as inability to accurately measure thermoelectric figure of merit, and achieve the goal of eliminating the effects of air convection heat loss and radiation heat loss Effect
Active Publication Date: 2021-06-01
INST OF ENGINEERING THERMOPHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology
[0004] In order to solve the problem that the existing technology cannot accurately measure the thermoelectric figure of merit, the present invention proposes a method and device for direct in-situ comprehensive measurement of the thermoelectric properties of micro-nano materials, which can directly measure the thermoelectric properties of the same micro-nano sample (film or fiber). Accurately measure the ZT, thermal conductivity, electrical conductivity and Seebeck coefficient of the sample at one time
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[0025] In order to better understand the present invention, the content of the present invention is further illustrated below in conjunction with the examples, so that the advantages and characteristics of the present invention can be more easily understood by those skilled in the art. It should be noted that the following descriptions are only preferred embodiments of the present invention, but the content of the present invention is not limited to the following embodiments. In fact, it will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the scope or spirit of the invention. For example, features illustrated or described as part of one embodiment can be used with another embodiment to yield still a further embodiment. Therefore, it is intended that the present invention cover such modifications and variations as come within the scope of the appended claims and their equivalents.
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Abstract
The invention discloses a method and a device for direct in-situ comprehensive measurement of thermoelectric properties of a micro-nano material. The method comprises the steps of employing a symmetrical double H-shaped suspended micro-nano electrode as a sample measurement probe, and eliminating the influence of heat conduction and heat loss between the electrode and a substrate, and fixedly connecting the sample and the electrode through FIB or conductive and heat-conducting glue, so that the influence of contact resistance and contact thermal resistance is eliminated. A sample and a probe are placed in a high-vacuum environment, so that the air convection heat loss influence is eliminated; the heating electrode adopts low-power heating, the voltage is measured by adopting a high-resolution nanovoltmeter or a lock-in amplifier and the like, and the influence of radiation heat loss caused by overhigh heating of the electrode is eliminated. The ZT, the conductivity, the heat conductivity and the Seebeck coefficient of the same sample can be accurately measured at a time.
Description
technical field [0001] The invention belongs to the field of thermoelectric materials, and in particular relates to a method and a device for directly in-situ comprehensively measuring the thermoelectric properties of micro-nano materials. Background technique [0002] Thermoelectric materials are non-polluting green energy materials that use the thermoelectric effect to directly convert heat and electricity. With the rapid development of nanotechnology, the thin film and fiberization of thermoelectric materials through nanotechnology can not only greatly improve their thermoelectric efficiency, but also can be widely used in the medical field, military field and human body temperature monitoring. The thermoelectric conversion efficiency of thermoelectric materials is generally measured by the thermoelectric figure of merit (ZT), but there is currently no method and equipment that can directly measure the thermoelectric figure of merit in the world, and the thermal parameter...
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IPC IPC(8): G01N25/20G01N25/18G01N27/04
CPCG01N25/20G01N25/18G01N27/041
Inventor 郑兴华杨啸张挺陈海生
Owner INST OF ENGINEERING THERMOPHYSICS - CHINESE ACAD OF SCI