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Defect positioning method based on context awareness

A positioning method and context technology, applied in neural learning methods, instruments, biological neural network models, etc., can solve the problem of not considering the accuracy of defect positioning, and achieve the effect of improving defect positioning and improving effectiveness

Active Publication Date: 2021-06-15
CHONGQING UNIV
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Problems solved by technology

Therefore, only relying on test case results and test case coverage information without considering the complex internal relationship in the defect context will affect the accuracy of defect location

Method used

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  • Defect positioning method based on context awareness
  • Defect positioning method based on context awareness
  • Defect positioning method based on context awareness

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Embodiment Construction

[0051] The present invention will be described in further detail below.

[0052] The invention utilizes the learning ability to build a model capable of simulating complex correlations in the defect context, so as to achieve the purpose of integrating the error statement context into the defect location technology. Therefore, we propose a context-aware defect localization technique, called CAN for short. It is worth noting that CAN simulates the defect context by building a program dependency graph. This context can display a series of statements that affect each other (data dependence and control dependence) collection. CAN uses graph neural network technology to simulate the propagation of defects in the defect context, and integrates the defect context into the defect location system, so that the position of the defect statement can be accurately located. Experiments show that in 12 large-scale real programs, CAN can achieve a very accurate positioning effect, and 49.23% o...

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Abstract

The invention relates to a defect positioning method based on context awareness, which is characterized in that a program slicing technology is utilized to construct a defect context, the context can be expressed as a directed graph expressed by a program dependency graph, nodes in the graph are statements having a direct or indirect association relationship with failures, and edges are association relationships among the statements. On the basis of the graph, the CAN embeds each node in the graph into a node representation vector by adopting one-hot coding, a dependency relationship between statements is obtained by utilizing GNN, and the CAN is trained by utilizing a test case on the basis of the node representation vectors, so that a more accurate node representation vector can be obtained. And finally, a virtual test case set is constructed through a method that each statement in the defective context statements of the defective target program is covered by only one test case and only one defective context statement is covered by one test case. The test case set is input into the trained GNN to obtain a suspicious value of each statement. According to the method, defect context is analyzed and incorporated into suspicious evaluation to improve defect positioning, and experimental analysis shows that the method can obviously improve the effectiveness of defect positioning.

Description

technical field [0001] The invention relates to a defect location method, in particular to a context-aware defect location method. Background technique [0002] Automated software debugging technology plays a very necessary role in helping developers reduce the time-consuming and laborious labor in the testing process, and it can greatly reduce the burden on developers. Researchers have therefore proposed many software defect localization methods to assist developers in finding defects in programs by analyzing program execution that leads to unexpected outputs. Among them, the method based on program spectrum (SFL) is one of the most popular defect localization methods. [0003] The defect localization method based on program spectrum (SFL) uses program coverage information and test case results to build a defect localization model and calculates the suspicious value of each executable statement in a program as a defect statement. SFL defines an information model called a ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06N3/04G06N3/08
CPCG06F11/3676G06F11/368G06F11/362G06N3/084G06N3/045Y02P90/30
Inventor 雷晏张卓刘春燕谢欢鄢萌徐玲徐洲
Owner CHONGQING UNIV
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