Defect positioning method based on context awareness
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- CHONGQING UNIV
- Publication Date
- 2021-06-15
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Abstract
Description
technical field
[0001] The invention relates to a defect location method, in particular to a context-aware defect location method. Background technique
[0002] Automated software debugging technology plays a very necessary role in helping developers reduce the time-consuming and laborious labor in the testing process, and it can greatly reduce the burden on developers. Researchers have therefore proposed many software defect localization methods to assist developers in finding defects in programs by analyzing program execution that leads to unexpected outputs. Among them, the method based on program spectrum (SFL) is one of the most popular defect localization methods.
[0003] The defect localization method based on program spectrum (SFL) uses program coverage information and test case results to build a defect localization model and calculates the suspicious value of each executable statement in a program as a defect statement. SFL defines an information model called a ...