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Abnormal chip data state distribution statistical system and method

A technology of data status and distribution statistics, applied in static memory, instruments, etc., can solve the problems of long test time, complex software logic, occupying CPU resources, etc., to achieve the effect of shortening the acquisition time

Active Publication Date: 2021-06-25
YANGTZE MEMORY TECH CO LTD
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0003] In related technologies, the data state distribution of statistical chips requires a large amount of data calculations, and the software logic is complex, and these large amounts of data calculation processes are implemented in a central processing unit (Central Processing Unit, CPU), occupying a large amount of CPU resources , the power consumption of the device is large; in addition, when counting the state distribution of chip data in related technologies, there are a large number of memory access operations, resulting in long test time

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  • Abnormal chip data state distribution statistical system and method
  • Abnormal chip data state distribution statistical system and method
  • Abnormal chip data state distribution statistical system and method

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Embodiment Construction

[0038] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the specific technical solutions of the invention will be further described in detail below in conjunction with the drawings in the embodiments of the present application. The following examples are used to illustrate the present application, but not to limit the scope of the present application.

[0039] In the following description, use of suffixes such as 'module' or 'unit' for denoting elements is only for facilitating the description of the present application and has no specific meaning by itself. Therefore, "module" or "unit" can be used mixedly.

[0040] A Cell of TLC can store 3-bit data, so there are 8 data states in TLC. Usually, the data stored in TLC will be evenly distributed to each data state. Therefore, each Data states are completely independent of each other and do not overlap. However, due to the bit flipping phenomenon, the data ...

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Abstract

The embodiment of the invention provides an abnormal chip data state distribution statistical system and method, and the system at least comprises: a sampling comparison module which is used for comparing expected data under each column address with read data of the corresponding column address under different read voltages to obtain an error bit information set under each reading voltage and a column address of an error bit unit corresponding to each piece of error bit information; a signal generation module which is used for generating a control signal corresponding to a data state according to the data state in the data state set corresponding to the expected data; and a selection module which is used for screening target error bit information corresponding to a target column address from the error bit information set according to the control signal and the column address so as to count the data state distribution of the abnormal chip through the target error bit information.

Description

technical field [0001] The present application relates to the field of semiconductor testing, and relates to but not limited to a system and method for statistical distribution of data status of abnormal chips. Background technique [0002] Flash memory (NAND Flash) can be divided into single-level storage cells (Single-Level Cell, SLC), double-level storage cells (Multi-Level Cell, MLC) and triple-level storage cells (Triple-Level Cell, TLC) through different storage principles , where one memory cell (Cell) of the TLC stores 3-bit (Bit) data, so there are 8 data states in the TLC. Normally, the data stored in the TLC will be evenly distributed to each data state. However, due to the bit flipping phenomenon, the data state of the stored data will change, so it is particularly important to count the data state distribution of the chip. [0003] In related technologies, the data state distribution of statistical chips requires a large amount of data calculations, and the so...

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Application Information

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IPC IPC(8): G11C29/44G11C29/50
CPCG11C29/44G11C29/50G11C2029/5004
Inventor 李康彭聪
Owner YANGTZE MEMORY TECH CO LTD