Multifunctional sample test bench for X-ray electron spectrometer

A technology of electron energy spectrum and sample test, applied in the field of material analysis equipment, to achieve good signal acquisition, solve the effect of unable to perform data acquisition and no detection signal

Pending Publication Date: 2021-07-27
XIAN UNIV OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to provide a multifunctional sample test bench for X-ray electron spectrometer, which...

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  • Multifunctional sample test bench for X-ray electron spectrometer
  • Multifunctional sample test bench for X-ray electron spectrometer

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Embodiment Construction

[0020] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0021] In the description of the present invention, if the first and the second are described only for the purpose of distinguishing technical features, it cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features or implicitly indicating The sequence of the indicated technical features.

[0022] In the description of the present invention, unless otherwise clearly defined, words such as setting, installation, and connection should be understood in a broad sense...

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Abstract

The invention provides a multifunctional sample test bench for an X-ray electron spectrometer. The multifunctional sample test bench comprises a first test bench and a second test bench which are made of non-magnetic materials, a sample can be placed on the first test bench, and the position of the sample can be adjusted in the horizontal X and Y directions; and the structure of the second test bench is the same as that of the first test bench, and a sample can be placed on the second test bench for position adjustment in the Z direction. The multifunctional sample test bench of the X-ray electron spectrometer solves the problem that an existing X-ray electron spectrometer is difficult to test special-shaped samples or samples with large sizes.

Description

technical field [0001] The invention belongs to the technical field of material analysis equipment, and in particular relates to a multifunctional sample test bench for an X-ray electron energy spectrometer. Background technique [0002] X-ray photoelectron spectrometer can analyze the valence state of the element composition of most solid samples, and can complete quantitative and semi-quantitative at the same time. It has been widely used in elemental analysis, multiphase research, and compound structure identification; it is oxidation, corrosion , friction, lubrication, combustion, catalysis, coating and other micro-mechanism research indispensable research tools. [0003] X-ray photoelectron spectrometer can test most solid samples, but it cannot test some special-shaped samples or larger-sized samples. The reason for the inability to test is mainly due to the relatively large volume of the sample, which cannot be fixed in the sample chamber. Contents of the invention...

Claims

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Application Information

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IPC IPC(8): G01N23/2273G01N23/2204
CPCG01N23/2273G01N23/2204
Inventor 李颖任洋雷黎韩红梅
Owner XIAN UNIV OF TECH
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